Marvell International Limited

Hungchi Chen

Albert M Wu

Abdul Elaydi

Bruce Wang

Chiping Ai

Some of the embodiments of the present disclosure provide an integrated circuit (IC) chip comprising a die, a system on chip (SOC) coupled to the die, and an internal test engine included in the SOC and configured to test the die, wherein one or more components within the IC chip may be configured to be tested by an external test engine coupled to the IC chip. Other embodiments are also described and claimed.

Test engine for integrated circuit chip testing

Embodiments of the present disclosure provide a method that includes producing an integrated circuit device configured to include a system on a chip (SOC) and accessing test code within the SOC during the producing. The method further includes self-testing the integrated circuit device with the test code.

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San Jose, CA, United States of America

Hungchi Chen