Gigamon Inc.

Kla Tencor Corporation

Lumina Instruments Inc.

Zeta Instruments, Inc.

Kla-tencor Technologies Corporation

Intel Corporation

Brocade Communications Systems, Inc.

Blue7 Communications

Applied Materials, Inc.

Marvell International Limited

Mentor Graphics Corporation

Sigma Designs, Inc.

Gigmon Inc.

Hung Phi Nguyen

Steven W Meeks

Rusmin Kudinar

Ronny Soetarman

Alireza Shahdoost Moghaddam

James Jianguo Xu

Ken K Lee

Zhen Hou

Zbigniew Sufleta

Jay Han Yu

Patrick Allen Riley

Hoang Nguyen Bao Nguyen

William R Wheeler

Richard L Hammons

Shankar Balasubramanian

Daniel Daly

Murali Bommana

Alireza Shahdoost Moghadam

Mahendra Prabhu Ramachandran

James Kleinsteiber

James Nelson Stainton

David P Thompson

Mark Joseph Saly

Arvind Srinivasan

Feng Quan Liu

Bhaskar Jyoti Bhuyan

Thomas E Willis

Junqing Phil Sun

Helia A Naeimi

Ning Wang

Liqi Wu

Vamsi Mohan Velidandla

Shehzad Merchant

Yan Xiu

Ramakrishna Manchiraju-Venkata

Qi Ming Ng

Danjin Wu

Hung Chuen Jason Lee

Tanmay Kishore

Namrata Limaye

Anoop K Somanchi

Sivakumar Munnangi

Vidya Renganarayanan

Sandeep Dahiya

Sitti Amarittapark

Dilip Suranjith Gunawardena

Pat Wang

Attila J Hunyady

Xiaoqian Xu

Vidya Renganararayanan

Alireza Shahdoostmoghadam

Arthur Kwun

Darren Seawright

Robert Ocheltree

Frederick Miller

Yanyan He

Gary Lin

MingFu Gong

Vishal Anand

Varsha Apte

Gargi Saha

A three-dimensional (3D) microscope includes various insertable components that facilitate multiple imaging and measurement capabilities. These capabilities include Nomarski imaging, polarized light imaging, quantitative differential interference contrast (q-DIC) imaging, motorized polarized light imaging, phase-shifting interferometry (PSI), and vertical-scanning interferometry (VSI).

3D microscope including insertable components to provide multiple imaging and measurement capabilities

Examples described herein relate to a Transport Layer Security (TLS) offload engine to: based on detection of encrypted data unassociated with a previously detected data header: search for one or more data headers; identify at least two candidate data headers for validation; and based on receipt of an indication that the at least two candidate data headers are valid, perform decryption of received data in one or more packets. In some examples, the TLS offload engine is to: based on receipt of an indication that one or more of the at least two candidate data headers is not a valid header, search for two or more other candidate data headers.

Offload of decryption operations

An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from a sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is reflected by the second non-polarizing beam splitter.

Scanning micro profiler

An optical scanning system including a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scanned light beam is created by focusing light reflected from the sample and the de-scan lens is located approximately one focal length of the de-scan lens from an irradiation location where the light beam irradiates the sample, a focusing lens that is configured to output a focused light beam, a collimating lens that is configured to output a collimated light beam, a polarizing beam splitter that is configured to be irradiated by the collimated light beam, and a detector that is configured to be irradiated by at least a portion of the collimated light beam that is not reflected by the polarizing beam splitter.

Slope, p-component and s-component measurement

An optical scanning system includes a radiating source capable of outputting a source light beam, a de-scan lens that is configured to output a de-scanned light beam, the de-scan lens is located approximately one focal length of the de-scan lens from an sample irradiation location, a focusing lens that is configured to output a focused light beam, a first non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam, a second non-polarizing beam splitter configured to be irradiated by at least a portion of the focused light beam that is reflected by the first non-polarizing beam splitter, and a detector that is located at approximately one focal length of the focusing lens from the focusing lens, the detector is configured to be irradiated by at least a portion of the focused light beam that is not reflected by the second non-polarizing beam splitter.

Surface contour measurement

An angle independent optical surface inspector capable of generating a light beam, directing the light beam to a sample, and de-scanning a reflected light beam that is reflected from the sample, thereby generating a first de-scanned light beam. The de-scanning is performed at approximately one focal length of a de-scanning lens from an irradiation location where the light beam irradiates the sample. The optical inspector also capable of focusing the first de-scanned light beam, thereby generating a focused light beam, and measuring the location of the focused light beam. The measuring of the location is performed at approximately one focal length of a focusing lens from the focusing lens. The incident angle of the light beam is within ten degrees of Brewster's angle. The focusing is performed by an achromatic lens.

Angle independent optical surface inspector

An optical scanning system including a radiating source that outputs a light beam, a time varying beam reflector that reflects the light beam through a scan lens towards a transparent sample at an incident angle of plus or minus ten degrees from Brewster's angle, a focusing lens configured to be irradiated by light scattered from the transparent sample, and a detector that is irradiated by the light scattered from the transparent sample. The detector outputs a signal that indicates an intensity of light measured by the detector. None of the light scattered from the transparent sample is blocked. The light scattered from the transparent sample is scattered from the top surface of the transparent sample, the bottom surface of the transparent sample, or any location in between the top surface of the transparent sample and the bottom surface of the transparent sample.

Region prober optical inspector

An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.

Time domain multiplexed defect scanner

An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanner causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.

Methods of depositing films are described. Specifically, methods of depositing metal oxide films are described. A metal oxide film is selectively deposited on a metal layer relative to a dielectric layer by exposing a substrate to an organometallic precursor followed by exposure to an oxidant.

Selective aluminum oxide film deposition

An optical scanning system, including: a radiating source that outputs a light beam, a first time varying beam reflector that reflects the light beam through a scan lens towards a transparent sample, a second time varying beam reflector that reflects the light beam reflected from the transparent sample, a focusing lens that focuses the light beam reflected from the transparent sample, a blocker, and a detector that is irradiated by the one or more selectable portions of the light beam reflected from the transparent sample that pass the blocker. The blocker can be configured to block one or more portions of the light beam reflected from the transparent sample so that one or more selectable portions of the light beam reflected from the transparent sample can pass the blocker.

A method for providing user access to a network switch appliance, includes: receiving from a user a request to access configuration item for the network switch appliance, the network switch appliance configured to pass packets received from a network to network monitoring instruments; and determining, using a processing unit, whether to allow the user to access the configuration item for the network switch appliance based on information regarding the user.

Security access for a switch device

Embodiments are disclosed for a network switch appliance with a traffic broker that facilitates routing of network traffic between pairs of end nodes on a computer network through a configurable sequence of in-line tools.

Traffic broker for routing data packets through sequences of in-line tools

Growing community of inventors

Santa Clara, CA, United States of America

Hung Phi Nguyen