Industrial Technology Research Institute

Hung-Ming Tai

Ching-Ming Yeh

Kai-Yu Cheng

Tsan-Lin Chen

Jung-Tsung Chou

Huang-Chi Huang

Chiung-Huei Huang

Nang-Chian Shie

Jin-Liang Chen

Fu-Shiang Yang

Shih-Hsuan Kuo

Shu-Ping Dong

Forest Shih-Sen Chien

Shih-Fang Lee

A system for alignment measurement for a rolling embossed double-sided optical film, the system comprising: a first roller with a first brightness enhancement film pattern and a first alignment pattern thereon, a second roller with a second brightness enhancement film pattern and a second alignment pattern thereon; a measuring unit for measuring diffraction patterns in the first alignment region and the second alignment region, respectively; and a control unit electrically connected to the first roller, the second roller and the measuring unit to adjust the relative position between the first roller and the second roller according to the diffraction patterns measured by the measuring unit.

System for alignment measurement for rolling embossed double-sided optical film and method thereof

This invention relates to a method and apparatus for controlling the length of a carbon nanotube, in cooperation with a substrate having at least one reference level on a surface of the substrate on which at least one carbon nanotube is formed, comprising at least one positioning platform for mounting and calibrating the substrate; a discharging electrode mounted on one side of the positioning platform to cut the carbon nanotube wherein the position of the discharging electrode can be calibrated with the positioning platform; a piezoelectric actuator for calibrating the position of the discharging electrode or the height of the discharging electrode relative to the substrate reference level; a position sensor for detection of the height of the substrate; and a voltage pulse supplying means for applying a voltage pulse to the discharging electrode to cut the carbon nanotube.

Electric discharge apparatus for controlling the length of a carbon nanotube

The invention relates to a tilting adjustable surface profilometer, comprising an apparatus capable of adjusting an image acquiring angle. The apparatus includes two types of frameworks. One is a translation-stage-type tilting adjustable surface profilometer, which is enabled by the translations of two translation stage with the rotation of a rotary rack, a surface profile with an omni-directional angle of a sample can be obtained. The other framework is a surface profilometer with an arc-trajectory tilting apparatus, which is enabled by guiding the surface profilometer to slide along the arc rails with the rotations of the rotary rack, a surface profile with an omni-directional angle of a sample can be obtained.

Tilting adjustable surface profilometer

A fiber optic interferometric position sensor and measurement method thereof suitable for determining the moving direction of a measurement object in an environment of high electric or magnetic field strengths are disclosed. The fiber optic interferometric position sensor comprises at least one light source, a plurality of fiber optic couplers, a plurality of sensing fibers and a plurality of photodetectors. The fiber optic couplers are connected to the at least one light source, the photodetectors, and the sensing fibers, respectively. The measurement method comprises: providing a fiber optic interferometric position sensor and a measurement object, obtaining two initial signals having a 90-degree phase difference therebetween, obtaining two measured signals, correcting the measured signals by a bias correction method, obtaining the phase value from the two measured signals by an electronic interpolation technique, and obtaining the position of the measurement object after computation by using the phase value.

Fiber optic interferometric position sensor and measurement method thereof

Method and apparatus for controlling the length of a carbon nanotube

A method for oxidizing a nitride film is disclosed, which includes the steps of: providing a nitride film formed on an electrically conductive substrate; irradiating the nitride film with a light beam and getting close to the nitride film with a electrically conductive probe; and exerting a bias between the electrically conductive substrate and the electrically conductive probe. The method can oxidize the nitrides quickly and reduce the cost building a nano-structure in the nitride film. An apparatus for oxidizing a nitride film is also disclosed herewith.

Method and apparatus for oxidizing nitrides

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Hsinchu, Taiwan

Hung-Ming Tai