United Microelectronics Corp.

Hung-Kang Lien

Yu-Jen Liu

Wei-Cheng Hung

The invention provides a method for reducing mismatch of semiconductor device patterns, which comprises the following steps: defining an initial lithography area which partially overlaps a target gate structure, a first gate structure and a second gate structure; if a length and a width of the target gate structure are smaller than a preset channel length and a preset channel width respectively, adjusting and reducing the area of the initial lithography area to define a second lithography area. The second lithography area partially overlaps with the target gate structure but does not overlap with the first gate structure and the second gate structure, and the second lithography region is defined as the active area.

Growing community of inventors

Kaohsiung, Taiwan

Hung-Kang Lien