International Business Machines Corporation

Humberto Felipe Casal

Hehching Harry Li

Nandor G Thoma

Trong Duc Nguyen

Kurt Alan Feiste

Larry Edward Thatcher

Joel Roger Davidson

David M Wu

Trong D Nguyen

T W Griffith

Mark L Shulman

Campbell H Snyder

Rafey Mahmud

David Ming-Whei Wu

Yuan C Lo

The present invention utilizes a test circuit for receiving a reference clock signal and a sense clock signal and subsequently determining whether or not the reference and sense clock signals are either correct multiples of each other and/or in phase with each other. The test circuit may be located on the same chip with the microprocessor and the clock circuitry. The clock circuitry may include a phase locked loop (&ldquo;PLL&rdquo;) circuit for receiving the reference clock signal and producing a sense clock signal for use by the remainder of the chip, wherein the sense clock signal is a multiple of the reference clock signal. The test circuit may count the number of cycles of the sense clock signal occurring within a predetermined amount of time, which may be proportional to the reference clock period. Alternatively, the sense clock signal and the reference clock signal may be passed through an XOR circuit and then the number of cycles counted within a predetermined time period. In both cases, if the number of cycles counted is not what was expected, then it is known that the sense clock signal was not properly produced by the PLL circuit.

System and method for testing a clock signal

A data processing system has a memory bus and a system input/output (I/O) bus including I/O drivers. The memory and I/O buses are controlled by a central processor unit (CPU) for transferring data therebetween and to the I/O drivers. A central clock provides clock signals to the CPU, the memory bus and the I/O bus. The central clock further provides memory and I/O phase alignment signals to the CPU, the alignment signals indicating to the CPU when the start of the CPU clock cycle coincides with the start of a memory bus clock cycle or I/O bus clock signal. Circuit means responsive to the phase alignment and CPU clock signals initiate the transfer of data to the memory and I/O data buses in alternate CPU clock signals to reduce the number of I/O pin switching at any given time thereby reducing the noise and power consumption at the I/O pins and in the system.

Data processing system and method of operation having input/output

A phase detector circuit receives both a reference clock signal and a sense clock signal and produces a synchronization signal if the sense and reference clock signals are in phase within a specified tolerance. A lead/lag signal is provided to a skew control circuit and accompanying delay circuits to increase or decrease the amount of delay on the reference clock signal and the sense clock signal if the two signals are not in phase within the specified tolerance. The sense clock signal is a feedback signal returned from logic circuitry, which originally receives the reference clock signal, which may be supplied by a master clock signal within a processor.

Three state phase detector

A computer system is provided with microprocessor clocking control by providing a clock having output timing signals which vary based on input signals to the clock, setting timing parameters for the clock using a service processor which sends the input signals to the clock, and controlling the primary processor using the output timing signals from the clock. The service processor can be used to modify a pulse width of at least one of the output timing signals, and to delaying a first one of the output timing signals with respect to a second one of the output timing signals. Separate clock signals can be provided for the primary processor and other system components, such as a cache connected to the primary processor, a memory device of the computer system, or an input/output device of the computer system. The clock has a programmable duty-cycle control circuit. The duty-cycle control circuit may use delay chains having a plurality of individually selectable delay elements.

Microprocessor clocking control system

During power up and power down of logic circuitry implemented in CMOS, the clock signal supplied to the logic circuitry is incremented and decremented, respectively, to avoid a sudden application or removal of the clock signal to the logic circuitry.

Controlling power up using clock gating

A clocking system for complex electronic devices is created in an hierarchial manner whereby the master clock pulse is provided to a plurality of digital pulse aligners which in turn provide phase aligned clock signals at the field replaceable unit level to either a slave clock or a digital phase aligner. The slave clock or the digital phase aligner at the field replaceable unit level in turn provides an aligned clock pulse to a timing node on respective chips. A third level of the hierarchy provides similarly aligned pulses to individual using-circuits on the chips of the system. The digital phase aligner, aligning the output pulse at the timing node of the next level with the reference pulses being provided to the digital phase aligner at each level, insures that the timing pulses arriving at the utilizing circuits are synchronously aligned with clock pulses of the master clock. The system provides dramatic simplification of replacement of either field replaceable units or individual components within field replaceable units. The system is self-phasing and self-correcting to accommodate timing misalignments caused by any variations in the timing delays at all levels, thereby reducing the jitter that must be accommodated.

Hierarchical clocking system using adaptive feedback

The present invention utilizes a test circuit for receiving a reference clock signal and a sense clock signal and subsequently determining whether or not the reference and sense clock signals are either correct multiples of each other and/or in phase with each other. The test circuit may be located on the same chip with the microprocessor and the clock circuitry. The clock circuitry may include a phase locked loop ('PLL') circuit for receiving the reference clock signal and producing a sense clock signal for use by the remainder of the chip, wherein the sense clock signal is a multiple of the reference clock signal. The test circuit may count the number of cycles of the sense clock signal occurring within a predetermined amount of time, which may be proportional to the reference clock period. Alternatively, the sense clock signal and the reference clock signal may be passed through an XOR circuit and then the number of cycles counted within a predetermined time period. In both cases, if the number of cycles counted is not what was expected, then it is known that the sense clock signal was not properly produced by the PLL circuit.

A dynamically switchable clock system having a symmetrical output signal includes a frequency doubler which couples the input frequency to provide greater resolution and synchronization of an output signal to an input signal in the frequency divider and the facility to handle odd divides as even divides at double frequency, a counter controlled by a divisor select signal, first and second compare circuits which compare against the preprogrammed count for division, the compare circuits receiving an input from the divisor select circuits, and having outputs to a counter reset line and to an output clock S/R latch which provides the frequency divided symmetrical output signal.

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Austin, TX, United States of America

Humberto Felipe Casal