Lsi Logic Corporation

Infineon Technologies Ag

Human Boluki

Benjamin Mbouombouo

Johann Leyrer

Juergen Dirks

Rex Kho

Juergen K Lahner

Weidan Li

Ludger F Johanterwage

Markus Schuemmer

Alaa A Alani

Circuits and methods are provided for a signal path between circuit parts. During normal operation, a delay is deactivated. During a burn-in test, the delay is activated. In the deactivated state, a delay component may be disconnected from a supply voltage.

Burn-in testing of circuits

An apparatus comprising one or more groups of boundary scan cells, one or more group buffers, one or more repeater buffers and a controller. The group buffers may be coupled to each of the groups of boundary scan cells. The repeater buffers may be coupled in series with the group buffers. The controller may be coupled to the groups of boundary scan cells through the group buffers and the repeater buffers. The apparatus may be configured to buffer the groups of boundary scan cells to reflect an order of I/Os around the apparatus.

Optimized buffering for JTAG boundary scan nets

A method and system is disclosed to improve the turnaround time to provide adequate time to meet project schedules in the event that adjustments or modifications to the design are necessary. A method for improving a turnaround time for design verification of a process database representing a semiconductor design includes the steps of (a) deriving a timing database and a (DNE) database from the process database; (b) performing, using the timing database, one or more design changes and one or more timing verifications and corrections to generate a modified timing database; (c) initiating, using the process database, physical validation of the semiconductor design prior to completion of step (b) to generate a modified DNE database; (d) merging the modified timing database with the modified DNE database to form a modified process database; and (e) performing, using the modified process database, one or more design verification checks of the semiconductor design.

Split and merge design flow concept for fast turnaround time of circuit layout design

An apparatus comprising a first circuit, a second circuit and a third circuit is disclosed. The first circuit may be configured to generate a plurality of intermediate signals from a data signal. Each of the intermediate signals may be switchable between (i) a common delay and (ii) one of a plurality of different staggered delays determined by a stagger signal. The a second circuit may be configured to generate a plurality of first drive signals by gating the intermediate signals with a plurality of enable signals. The a third circuit may be configured to generate a plurality of first output signals at a transmit interface of a chip by buffering the first drive signals.

Test structures for simultaneous switching output (SSO) analysis

A method for performing timing driven interconnect estimation analysis is disclosed. The method includes collecting data only from timing critical paths of at least one previous design, and generating statistical data based on a net length distribution of the timing critical paths. A wire load model is then generated for a new design from the statistical data.

Growing community of inventors

Munich, Germany

Human Boluki