Huawei Technologies Co., Limited

Huiling Zhen

Yu Huang

Mingxuan Yuan

Wanqian Luo

Naixing Wang

Miaohui Chen

An automatic test pattern generation-based circuit verification method, comprises determining a to-be-detected first logic cone from a fan-out logic cone corresponding to the target line; determining, based on the first logic cone, a to-be-detected second logic cone from a fan-in logic cone corresponding to the target line; generating a first conjunctive normal form (CNF) based on the first logic cone and the second logic cone, and detecting the target line by using the first CNF to obtain a first detection result; and if the first logic cone is a partial region in the fan-out logic cone, and the first detection result meets a first specified condition corresponding to the first logic cone, determining a first verification result of the target line based on the first detection result.

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Hong Kong, China

Huiling Zhen