Hon Hai Precision Industry Co., Ltd.

Hui-xian Yang

Cheng-Feng Wang

Li-che Lin

Yen-yi Lin

A method of identifying characters in images extracts features of a detection image including characters. Enhancement processing is performed on the detection image according to the features to obtain an enhanced image. Closed edges of the characters are detected in the enhanced image. First rectangular outlines of the characters are determined according to the closed edges. The first rectangular outlines are corrected to obtain second rectangular outlines. The characters are cropped from the detection image according to the second rectangular outlines. The method identifies characters in images accurately and rapidly.

Method of identifying characters in images, electronic device, and storage medium

A method of recognizing target objects in images obtains a detection image of a target object. A template image is generated according to the target object. The detection image is compared with the template image to obtain a comparison result. Candidate regions of the target object are determined in the detection image according to the comparison result. At least one target region of the target object is obtained from the candidate regions. The method detects target objects in images very rapidly.

Method of detecting target objects in images, electronic device, and storage medium

This application provides an image defect detection method. The method includes obtaining a first image and a second image of a flawless image. A third image is obtained from the second image and the first image, and a fourth image is obtained according to the second image and an image to be detected. A fifth image is obtained based on the third image and the second image. A sixth image is obtained based on the third image and the fourth image. A seventh image is obtained from the fifth image and the sixth image. A defect value of the fourth image is obtained according to the third image and the seventh image. A detection result of the fourth image is determined based on the defect value.

Growing community of inventors

Taipei, Taiwan

Hui-xian Yang