China Automotive Technology and Research Center Co. Ltd

Catarc Automotive Test Center (Tianjin) Co., Ltd

China Automotive Chip (Shenzhen) Technology Co., Ltd.

Catarc New Energy Vehicle Test Center (Tianjin) Co., Ltd.

Catarc Automotive Test Center (Guangzhou) Co., Ltd.

Hui Rong

Hanbing Wu

Mingyang Li

Rui Zhao

Yujia Li

Lixiong Zhang

Changqing Dong

Xianzhao Xia

Ruiqing Zhai

Mingkai Yan

Guokai Jiang

Jinfeng Gong

Zhao Wang

Guotian Ji

Hang Sun

Jiaxu Feng

Xu Zhang

Liang Huang

Zhiruo Zhang

Yifu Ding

Yan Fan

Guangyu Zhang

Yunlei Zhang

Yaozong Xu

Jiarui Zhang

Yuning Li

Jingjing Hao

Disclosed in the present application is a high-spatial-accuracy electromagnetic fault injection method for a cryptographic chip. According to the method, a spatial position of an electromagnetic probe is adjusted according to a physical structure of a target chip and the characteristic of an integrated circuit, including accurate positioning of three dimensions of X, Y and Z as well as an angle with a surface of the chip, so that electromagnetic fault injection acts on a key area of the chip more accurately, thereby improving the pertinence and efficiency of fault injection.

High-spatial-accuracy electromagnetic fault injection method for cryptographic chip

Disclosed in the present application are a high-temporal-accuracy power glitch fault injection method and apparatus for a cryptographic chip. According to the method, power glitch fault injection time is adjusted by considering rise time of a power glitch fault, so that the power glitch fault injection time is controlled more accurately, the limitation of the power glitch fault injection in temporal accuracy is reduced, and the success rate of the power glitch fault injection is increased.

High-temporal-accuracy power glitch fault injection method and apparatus for cryptographic chip

Disclosed in the present application are a high-temporal-accuracy electromagnetic fault injection method and apparatus for a cryptographic chip. The method includes: adjusting fault injection time jointly according to peak time and rise time of an electromagnetic pulse signal, thereby enhancing the accuracy of controlling injection time, improving the analysis efficiency and effect of differential fault analysis, and increasing the success rate of the effective fault injection.

High-temporal-accuracy electromagnetic fault injection method and apparatus for cryptographic chip

Disclosed are an OTA test method for a vehicle antenna system, a device and a storage medium. According to the method, the radio frequency performance of a physical layer of a whole vehicle antenna system can be tested, and the problem in the prior art that the test result of parts cannot accurately reflect the performance of the whole vehicle antenna system can be solved.

OTA test method for vehicle antenna system, device, and storage medium

A testing method for a blind spot detection system for an automobile includes: applying an electromagnetic interference signal to the tested automobile through an electromagnetic interference signal application device, meanwhile, simulating a static obstacle or a moving obstacle within a detection range through a testing device, and if the blind spot detection system for the tested automobile is activated, determining that the testing is passed. Repeatable and reproducible testing for the electromagnetic safety of the blind spot detection system may be realized.

Testing method for blind spot detection system for automobile, device, and medium

Growing community of inventors

Tianjin, China

Hui Rong