Shimadzu Research Laboratory (shanghai) Co., Ltd.

Shimadzu Corporation

Hui Mu

Li Ding

Gongyu Jiang

Tao Lin

Wenjian Sun

Jianliang Li

The present invention provides a method for preparing an ion optical device. A substrate is fabricated with a hard material adapted for a grinding process, the substrate at least including a planar surface, and including at least one insulating material layer. Next, one or more linear grooves are cut on the planar surface, to form multiple discrete ion optical electrode regions on the planar surface separated by the linear grooves. Then, conductive leads are fabricated on other substrate surfaces than the planar surface and in a through hole inside the substrate, to provide voltages required on ion optical electrodes. By using high-hardness materials in cooperation with high-precision machining, higher precision and a desired discrete electrode contour can be obtained.

Method for manufacturing ion optical device

A tandem mass spectrometer is provided in the present invention. The mass spectrometer includes an ion source, a quadrupole mass filter located at downstream side of the ion source, a linear ion trap disposed at downstream side of the mass filter and an ion detector placed on the side of the ion trap, all of which are placed in a vacuum environment. The instrument can obtain MS meeting the standard spectral library search criteria by the quadrupole mass filter cooperating with linear ion trap, realize any multi-stage MS under two modes of axial collision and resonance excitation, and predict and optimize the inflow amount and types of samples under the ion trap analysis mode by the quadrupole. A tandem MS analysis method is also provided, which can repeatedly provide precursor ion selection, ion acceleration, achieve high-energy collision dissociation, low product ion mass discrimination effect.

Tandem mass spectrum analysis device and mass spectrum analysis method

The present invention relates generally to the field of ion storage and analysis, in particular to a linear ion trap mass analyzer comprised by multiple columnar electrodes. High frequency voltages are applied on at least one of the columnar electrodes to form ion confining space, which mainly consists of two-dimensional quadrupole electric radial trapping field, and there is at least one through slot for ion ejection in at least one direction perpendicular to the axis of the ion trap, wherein an AC electric field superposition is applied to invoke dipole excitation. Opposite to the through slot, there is an elongated electrode for field adjusting between two columnar electrodes or inside the slit of one of the columnar electrodes mentioned above. The potential on the elongated electrode for field adjusting is set as the sum of a portion of the high frequency voltage which applied on one adjacent columnar electrode and a DC offset, which can be adjusted freely. Through adjusting the portion of the high frequency potential and DC potential on this electrode, one or more objectives, including field optimization inside the ion trap as well as ion motion characteristics of resonant ejection, can be realized.

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Shanghai, China

Hui Mu