The Boeing Company

Hui Lin Yang

Matthew Mark Thomas

Xue Wu Liu

David J Sundquist

Steven M Volz

Xue Liu

A method is provided for measuring and quantifying optical distortion of a transparent object using a single image. Embodiments provided herein include a method including: receiving an image of an object and a transparent object, where the object is visible through the transparent object, where a portion of the image of the object is visible through the transparent object is an inside region of interest (iROI), where a portion of the image of the object not viewed through the transparent object is an outside region of interest (oROI); determining measured pixel locations for a plurality of identified pixels in the image, the plurality of identified pixels corresponding to the distinct points in the image; calculating virtual locations in the image representing the distinct points within the iROI; determining, for respective distinct points within the iROI, differences between the virtual location and the measured pixel location.

Method and apparatus for determining optical distortion of an object from a single image

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

Growing community of inventors

Derwood, MD, United States of America

Hui Lin Yang