Nuctech Company Limited

Tsinghua University

Nuray Technology Co., Ltd

Temple University

Huaping Tang

Chuanxiang Tang

Huaibi Chen

Yuanjing Li

Yaohong Liu

Zhiqiang Chen

Zhanfeng Qin

Jinsheng Liu

Xinshui Yan

Wenhui Huang

Huayi Zhang

Yonggang Wang

Wei Jia

Jianjun Gao

Shuxin Zheng

Jinsong Pan

Ziran Zhao

Xin Jin

Feng Gao

Shangmin Sun

Dan Zhang

Wei Yin

Chong Gu

Qinghui Zhang

Xiangyu Yin

Kejun Kang

Dongsheng Zhang

Li Ni Zhang

Jian Li

Yu Hu

Haifeng Hu

Hua Peng

Qingping Huang

Jinyu Zhang

Li Zhang

Zhuoyan Liu

Yangwei Zhan

Xiaotian Liang

De Wei

Yunda Sun

Nan Jiang

Chunguang Zong

Hu Tang

Yu He

Bicheng Liu

Weizhen Wang

Xiying Liu

Yumei Chen

Weiqiang Guan

Yanfeng Cao

The present application relates to a deflection electrode assembly, an X-ray source, and an X-ray imaging system. The deflection electrode assembly includes: a first electrode plate, including a first connection portion and a plurality of first tooth portions, wherein the first electrode plate is formed as a comb shape; and a second electrode plate, including a second connection portion and a plurality of second tooth portions, wherein the second electrode plate is formed as a comb shape. The first electrode plate and the second electrode plate are not in contact with each other, and the plurality of first tooth portions and the plurality of second tooth portions are arranged at least partially in a staggered manner to form a plurality of electron beam passageways; each electron beam passageway is located between adjacent first and second tooth portions.

Deflection electrode assembly, X-ray source, and X-ray imaging system

The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

Backscatter imaging device, control method and inspection system

A power supply circuit and a field emission electron source are provided. The power supply circuit includes: field effect transistors Scoupled in series via drains and sources in sequence, wherein 1≤i≤n, n≥2, and wherein a source of Sis coupled to a negative electrode of a voltage source, and a drain of Sis used as an output terminal of the power supply circuit to couple to a load; a first group of diodes Dcoupled in series; a first group of resistors R, 2≤j≤n; and a current feedback module configured to adjust an internal resistance of the field effect transistors S, coupled in series in sequence, so as to cause a current passing through the load to be constant; wherein the field effect transistors S, 1≤i≤n, operate in a constant current region.

Power supply circuit and field emission electron source

A power supply circuit and a field emission electron source are provided. The power supply circuit includes: field effect transistors Scoupled in series via drains and sources in sequence, 1&#x2264;i&#x2264;n, i and n are natural numbers, n&#x2265;2, and a source of Sis coupled to a negative electrode of a voltage source, and a drain of Sis used as an output terminal of the power supply circuit to couple to a load; a first group of diodes Dcoupled in series; a first group of resistors R, 2&#x2264;j&#x2264;n, and i and j are natural numbers; and a voltage control module configured to adjust an output voltage of the voltage source to cause a current passing through the load to be constant; the field effect transistors S, 1&#x2264;i&#x2264;n, operate in a resistive region.

Constant current-controlled power supply circuit and field emission electron source

A time-division multiplexing control device applied to a distributed X-ray source includes: a first switch module with a number of first switches that receive a high-voltage signal and a first control signal, selectively turning on one of the plurality of first switches according to the first control signal and sending the high-voltage signal through the first switch turned on; and a cathode control module including a plurality of cathode control stages in one-to-one correspondence with the plurality of first switches, used for receiving the high-voltage signal from the first switch module and sending working state data through a cathode control stage corresponding to the first switch turned on in the plurality of cathode control stages, where each cathode control stage includes a cathode control unit and a cathode.

Time-division multiplexing control device and system

Embodiments of the present disclosure disclose a multi-output high-voltage power supply including a channel selection circuit () including a plurality of switches; and a high-voltage power supply module () connected to the channel selection circuit (), wherein the high-voltage power supply module () includes a fine adjusting power supply component () and a plurality of coarse adjusting power supply components (-to-N) connected in series, wherein one high-voltage output terminal of the high-voltage power supply module () is connected to a common terminal of the channel selection circuit (), and the other high-voltage output terminal of the high-voltage power supply module () is grounded through a current sampling resistor.

Multi-output high-voltage power supply and distributed ray source with multi-output high-voltage power supply

An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.

X-ray product quality automatic inspection device

Embodiments of the present invention provide a trailed multiple-viewing-angle item inspection system and method of operating the same. The inspection system includes: a trailer vehicle, a radiation inspection device, a power supply device and a power grid connection device. The trailer vehicle is mounted with a power supply chamber within which a power supply device and a power grid connection device are mounted and an inspection chamber within which a radiation inspection device is mounted. The radiation inspection device includes: ray radiation source configured to emit X-rays from various positions, detectors, a body frame, a transfer device, a data and image process system and a display and operation device. The trailed multiple-viewing-angle item inspection system of the present invention can obtain a transmission image containing depth information of an item by its one pass through the device, and achieve a high-speed inspection, a good image quality and a high inspection efficiency of hazardous articles, and its flexibility and movability can meet requirements in various working conditions.

Trailed multiple-viewing-angle item inspection system and method of using the same

The present disclosure discloses a radiography system including: a ray source, comprising a plurality of X-ray generators which are distributed on one or more planes intersected with a moving direction of an object being inspected; a detector module comprising a plurality of detection units; a data collection circuit; a controller, configured to control at least two X-ray generators of the plurality of X-ray generators in the ray source to generate X-rays alternately such that the object is scanned by the generated X-rays; and control the detector module and the data collection circuit to respectively obtain detection data corresponding to the at least two X-ray generators; and a data processing computer, configured to create images of the object being inspected in view angles of the at least two X-ray generators based on the detection data. The above embodiments may implement a multi-view-angle perspective imaging system within a single scan plane by utilizing a distributed X-ray source and reuse of the detectors.

Radiography systems based on distributed ray source

The present invention may perform fluoroscopic imaging simultaneously on the subjects in at least two channels using only one electron accelerator, at least two sets of X-ray beams and at least two sets of detector systems, through the design of the electron accelerator, the shielding and collimating device, the at least two detector arrays and various mechanical composite structures. The X-ray fluoroscopic imaging system according to the present invention may be designed in specific forms of a stationary type, an assembled type, a track mobile type or vehicular mobile type, etc., and has advantages such as simple structure, low cost, strong function, good image quality and the like.

X-ray fluoroscopic imaging system

The present invention provides an X-ray generating apparatus and an X-ray fluoroscopy imaging system comprising the same. The X-ray generating apparatus comprises: an electron accelerator, an electron emission unit, and a target; and a shielding and collimating device, including a shielding structure and multiple collimators arranged in the shielding structure, wherein the collimators are thin gaps extending from the target to an exterior surface of the shielding structure and having an axis transverse an electron beam shooting the target, and at least two collimators forming different angles with the electron beam are arranged on the same side of a plane contains the electron beam shooting the target, and the planes where the collimators locate form angles from 30 degrees to 150 degrees with the electron beam shooting the target, to draw out planar beams having different draw-out angles, each having uniform intensity distribution in its respective plane.

X-ray generating apparatus and X-ray fluoroscopyimaging system equipped with the same

An X-ray product quality online inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device which is located between the distributed X-ray source and the detector for carrying the inspected product to pass through an X-ray radiation region, wherein the transport device is arranged as a continuous transport mechanism which matches a production line of the inspected product; and a power supply and control device, which is used to supply power to and control the X-ray product quality online inspection device.

X-ray product quality online inspection device

The present disclosure is directed to an electron source and an X-ray source using the same. The electron source of the present invention comprises: at least two electron emission zones, each of which comprises a plurality of micro electron emission units, wherein the micro electron emission unit comprises: a base layer, an insulating layer on the base layer, a grid layer on the insulating layer, an opening in the grid layer, and an electron emitter that is fixed at the base layer and corresponds to a position of the opening, wherein the micro electron emission units in the same electron emission zone are electrically connected and simultaneously emit electrons or do not emit electrons at the same time, and wherein different electron emission zones are electrically partitioned.

Electron source, X-ray source and device using the X-ray source

An apparatus and method to generate distributed x-rays. A hot cathode of an electron gun is used in vacuum to generate electron beams having certain initial movement energy and speed. Periodic scanning is performed with the initial low-energy electron beams, which are thus caused to be reciprocally deflected. A current-limiting device is provided in the travel path of the electron beams along the direction of the reciprocal deflection. Through holes arranged in an array on the current-limiting device, only part of the electron beams targeting specific positions can pass to form sequential electron beam currents distributed in an array. These electron beam currents are accelerated by a high-voltage electric field to obtain high energy, bombard an anode target, and thus sequentially generate corresponding focus spots and x-rays distributed in an array at the anode target.

Apparatuses and methods for generating distributed x-rays in a scanning manner

The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.

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Beijing, China

Huaping Tang