Faraday Technology Corporation

Huan-Yung Tseng

An-Ru Andrew Cheng

Tzu-Chun Liu

Chang-Song Lin

An integrated circuit for locating failure process layers. The circuit has a substrate with a scan chain disposed therein, having scan cells connected to form a series chain. Each connection is formed according to a layout constraint of a minimum dimension provided by design rules for an assigned routing layer. Since the connection in the assigned routing layer is constrained to a minimum, the scan chain is vulnerable to variations in processes relevant to the assigned routing layer. The scan chain makes it easier to locate processes causing low yield rate of the scan chain.

Integrated circuit capable of locating failure process layers

A circuit for control and observation of a scan chain. The circuit comprises a group of first scan cells connected in series, receiving a first data signal and outputting a second data signal, a multiplexer receiving the first and second data signal, and selectively outputting the first and second data signal in response to a selection signal, and a group of second scan cells connected in series, receiving the first or second data signal from the multiplexer, and outputting a third data signal.

Growing community of inventors

Hsinchu, Taiwan

Huan-Yung Tseng