Ultratera Corporation

Uniband Electronic Corp.

National Science Council

Huan-Ping Su

Chien-Hsin Su

Huang-Chung Cheng

Chung-Che Tsai

Jin-Chuan Bai

Wei-Heng Shan

Wei-Hao Chen

Han-Wen Liu

Shih-Tsun Lai

Chien-Shuo Li

Soon-Aik Lu

Jia-Woei Jean

Hui-Mei Chen

Chih-Yuan Su

Wei-Hsiu Hsu

A remote controller comprises a wireless communication interface and a processing unit. The wireless communication interface is communicatively connected with another remote controller. The processing unit is electrically connected with the wireless communication interface. The processing unit generates a first identification code and a second identification code and transmits the first identification code and the second identification code to the another remote controller through the wireless communication interface. The another remote controller transmits the first identification code and the second identification code to a controlled device to establish an indirect pairing relationship between the remote controller and the controlled device and a direct pairing relationship between the another remote controller and the controlled device. A pairing method of remote controllers is also disclosed.

Remote controller and paring method thereof

ISM-band printed antenna for a portion of a circuit board

A semiconductor package with a heat sink is provided, having a substrate formed with at least one opening penetrating therethrough. A heat sink is mounted on a surface of the substrate same as for forming solder balls and seals one end of the opening by a thermally conductive adhesive. At least one chip is mounted on the other surface of the substrate opposite to the heat sink via the thermally conductive adhesive and covers the other end of the opening. The thermally conductive adhesive is filled in the opening between the substrate and the heat sink and allows heat produced by the chip to be dissipated through a shorter thermally conductive path. By the above arrangement with the heat sink being mounted between the chip and an external device, the heat sink provides electromagnetic shielding between the chip and the external device and enhances electrical performance of the semiconductor package.

Semiconductor package with heat sink

A method of manufacturing semiconductor packages is proposed. A die carrier is provided having a plurality of substrate units. At least one semiconductor die is mounted on each substrate unit by an adhesive. Then the die carrier mounted with the dies is cured in a jig fixture. The jig fixture has a submold and at least one exhaust passage communicated with an external exhauster. Air in the jig fixture is drawn out by the external exhauster through the exhaust passage to form a negative-pressure environment in the jig fixture. The negative-pressure environment generates an attraction force to secure the dies to the submold and counteract thermal stresses produced in the die carrier, thereby preventing die cracking, warpage and delamination from occurrence, such that the planarity of the die carrier is assured and solder balls can be precisely secured to the die carrier in position.

Method of manufacturing semiconductor packages and a clamping device for manufacturing a semiconductor package

A semiconductor package and a method for fabricating the same are proposed. A chip has an active surface, and an opposing non-active surface. A plurality of conductive elements are mounted on the active surface and electrically connected to the chip. A first encapsulant is formed on the active surface of the chip, for encapsulating the active surface and conductive elements, wherein end portions of the conductive elements are exposed to outside of the first encapsulant, and adapted to be recessed in position with respect to an exposed surface of the first encapsulant. A plurality of conductive media are implanted at end portions of the conductive elements, allowing the chip to be electrically connected to an external device by the conductive elements and conductive media. A second encapsulant is formed on the non-active surface of the chip, and cooperates with the first encapsulant to provide mechanical strength for the semiconductor package.

Encapsulated semiconductor package free of chip carrier

A test fixture for semiconductor packages and a test method of using the test fixture are proposed. The test fixture is composed of a circuit board, an interposer and a covering member. The circuit board is used to accommodate semiconductor packages and electrically connect the semiconductor packages to a test device. The interposer is mounted on the circuit board, and formed with through holes for receiving the semiconductor packages therein. The covering member is attached onto the interposer, and provided with elastic mechanisms for holding the semiconductor packages in position. By using the test fixture, semiconductor packages can be firmly coupled to the test device where functional tests are performed.

Test fixture for semiconductor package and test method of using the same

A semiconductor package and a fabrication method thereof are provided. A plurality of first chips are mounted on and electrically connected to a substrate plate. A shielding structure including a shielding portion and a supporting portion is mounted on the substrate plate, wherein the supporting portion abuts against the substrate plate, and the shielding portion is formed with a plurality of openings corresponding in position to the first chips. An adhesive is applied through the openings to form adhesive layers respectively on the first chips. After removing the shielding structure from the substrate plate, a plurality of second chips are respectively stacked on the adhesive layers and electrically connected to the substrate plate. By performing molding and singulating processes, the packaged structure is singulated to form individual semiconductor packages. It is a characteristic advantage of forming the adhesive layers in a batch manner, making fabrication costs and time significantly reduced.

Semiconductor package and method for fabricating the same

A method for forming a bottom polysilicon electrode of a stacked capacitor for DRAMs makes use of a double-layered polysilicon structure and a phosphoric acid etching. When the double-layered polysilicon structure is etched with the phosphoric acid, the polysilicon grain boundary is etched at a rate faster than the polysilicon grain itself so as to enable the formation of a rugged surface and thus increases the total surface area.

Growing community of inventors

Hsinchu, Taiwan

Huan-Ping Su