Shenzhen Xpectvision Technology Co., Ltd.

Huabin Cheng

Peiyan Cao

Yurun Liu

Yu Zhang

Zhigang Wang

Disclosed herein is an amplifier, comprising: an op-amp configured to receive at an input thereof a first electric current; a first MOS capacitor connected to the input and an output of the op-amp.

Amplifier for dark noise compensation

Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels configured to generate an electric signal upon exposure to a radiation; an electronics system associated with each of the pixels, wherein the electronics system comprises a first memory on a first signal path and a second memory on a second signal path, both signal paths being between an input terminal and an output terminal of the electronics system; wherein each of the first memory and the second memory is configured to store the electric signal generated by the pixel the electronics system is associated with, configured to store the electric signal generated in another pixel, and configured to transmit the electric signal stored in the electronics system to another pixel; wherein the electronics system comprises a switch configured to select one of the signal paths.

Semiconductor image detector having redundant memory and/or memory bypass

Disclosed herein is a method to measure an intensity distribution of X-ray using an X-ray detector, the method comprising: determining values of dark current at at least three locations on the X-ray detector, wherein the three locations are not on a straight line; determining a spatial variation of absorptance of the X-ray using the values of the dark current; measuring an apparent intensity distribution of the X-ray; determining the intensity distribution by removing a contribution of the spatial variation the absorptance from the apparent intensity distribution.

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Shenzhen, China

Huabin Cheng