Compal Electronics, Inc.

Hsun-Hung Wang

Yi-Hsun Lin

Hao-Jung Chiou

Ching-Ji Liang

Tsang-Ming Chang

Tzu-Chiang Mi

Wei-Chih Shih

Chien-Lee Liu

Wen-Hua Kao

A simulation test system and a simulation test method are provided. The simulation test system includes a control device, a power setting device, and a data capture device. The control device generates a context control signal corresponding to one of a plurality of operating contexts. The power setting device generates at least one of a simulated charging power and a simulated load in response to the context control signal and provides at least one of the simulated charging power and the simulated load to a device under test to configure the device under test to generate test data in response to at least one of the simulated charging power and the simulated load. The data capture device captures the test data and provides the test data to the control device.

Simulation test system and simulation test method

A power management device and a management method thereof are provided. The power management device includes a switch, a detection circuit and a controller. The switch receives an external power. The detection circuit receives an internal power and at least one operation power. The detection circuit determines whether at least one of the internal power and the operation power is in a preset specification range or not to generate a protection activate signal. The controller sets a protection flag according to the protection activate signal, and generates a control signal according to the protection flag by executing an application program. The controller transmits the control signal to turn off the switch.

Power management device and management method thereof

Growing community of inventors

Taipei, Taiwan

Hsun-Hung Wang