Winbond Electronics Corporation

Windbond Electronics Corp.

Hsueh-Cheng Liao

A probe tip landing method for a measurement system is provided. The probe tip landing method includes performing a first descending operation to lower a probe toward a sample by a first descending distance; performing a second descending operation to lower the probe toward the sample; and performing an inspection operation during the second descending operation. The inspection operation includes an imaging operation, scanning the sample to obtain a first image including a probe tip of the probe; and a determining operation, checking the first image to determine that in the first image, whether a region connected with the probe tip becomes bright. The probe tip landing method further includes in response to the region connected with the probe tip in the first image becoming bright, determining that the probe has contacted a surface of the sample and the probe has landed successfully.

Measurement system and probe tip landing method

A holder system for a scanning probe microscope, including a holder and a fixer. The holder includes a holder top surface, and a holder sidewall. The holder top surface is configured to hold a sample. The holder sidewall extends from the holder top surface. The fixer includes a fixer fixing portion, and a fixer connecting portion. The fixer fixing portion is configured to affix the sample to the holder top surface. The fixer connecting portion is connected to the fixer fixing portion, and is affixed to the holder sidewall. An area to-be-tested of the sample is exposed to the fixer fixing portion.

Growing community of inventors

Yunlin County, Taiwan

Hsueh-Cheng Liao