Advanced Semiconductor Engineering, Inc.

Hsuan Yu Chen

Ian Hu

Meng-Kai Shih

Chun Hung Tsai

Shin-Luh Tarng

Ming-Han Wang

A measuring system includes a temperature-variable container, an optical device and an air conditioner. The temperature-variable container includes a transparent plate. The optical device includes a first optical sensor unit and a second optical sensor unit. The air conditioner is disposed between the transparent plate and the optical device.

Measuring system

An optical measurement equipment includes an adjustment apparatus and at least two image capturing devices. The image capturing devices have a depth-of-field and attached to the adjustment apparatus. The image capturing devices are adjusted by the adjustment apparatus such that a portion to be measured of a workpiece is located within the depth-of-field of the image capturing devices.

Optical measurement equipment and method for measuring warpage of a workpiece

An apparatus includes: a first image capture module, a second image capture module, and a first projector. The first image capture module has a first optical axis forming an angle from approximately 70&#xb0; to approximately 87&#xb0; with respect to the surface of a carrier. The second image capture module has a first optical axis forming an angle of approximately 90&#xb0; with respect to the surface of the carrier. The first projector has a first optical axis forming an angle from approximately 40&#xb0; to approximately 85&#xb0; with respect to the surface of the carrier.

Growing community of inventors

Kaohsiung, Taiwan

Hsuan Yu Chen