Agilent Technologies, Inc.

Verigy Pte. Ltd.

Hsiu-Huan Shen

Alan S Krech, Jr

Stephen Dennis Jordan

Input to a device under test (DUT) is reconstructed. For each trigger cycle of a tester in which data is to be input to the DUT stimulus, data is prepared to be placed as stimulus on pins of the DUT. Response information obtained from the DUT during a previous trigger cycle is used to construct formatting information used to adjust a value of the stimulus data. Reconstruction information sufficient to reconstruct the stimulus data is stored. The reconstruction information includes the formatting information. The reconstruction information is used to reconstruct the stimulus data placed on the pins of the device under test.

Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test

A waveform for an input/output signal for a device under test (DUT) is displayed. Data for the input/output signal is captured in accordance with a first data capturing mechanism. The waveform for the input/output signal is displayed using the captured data. A user is provided with an interface that allows the user to select a portion of the waveform for recapture using a second data capturing mechanism. Data for a portion of the input/output signal, corresponding to the portion of the waveform selected for recapture, is recaptured. The recapturing of data is performed using the second data capturing mechanism. The waveform for the input/output signal is redisplayed. The data recaptured using the second data capturing mechanism is used for displaying the portion of the waveform selected for recapture. The data captured in accordance with the first data capturing mechanism is used for displaying remaining portions of the waveform not selected for recapture.

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Saratoga, CA, United States of America

Hsiu-Huan Shen