Metal Industries Research & Development Centre

Hsiu-An Tsai

Shuo-Ching Chen

Nai-Chun An

Zong-Rong Liu

Chih-Lung Lin

Kuo-Yu Chien

Yuan-Chih Lin

A method for measuring a residual stress of a curved-surface bulk material includes steps of: locating a point at which a to-be-detected curved surface of a curved-surface bulk material has a highest curvature as a to-be-detected point; applying an instrument integrating an X-ray light resource and a detector, measuring the to-be-detected point by using an X-ray diffraction theory, and analyzing and calculating, in combination with a cos &#x3b1; method, a strain value measured by using the instrument; and calculating, in combination with material property measurement data of the curved-surface bulk material, a curved-surface residual stress by introducing a curved-surface bulk material residual stress calculation model.

Method for measuring residual stress of curved-surface bulk material

A residual stress detection device for a curved surface coating and a detection method thereof is provided, where its structure includes: a detection piece carrier, configured to fix the detection piece, so that a to-be-detected point on the detection piece remains at a highest point; an X-ray generation source, radiating an X-ray to the to-be-detected point fixedly or along a path; a detection element, including a moving mechanism, where the moving mechanism moves the detection element along a path extending toward a direction orthogonal to an incident direction of the X-ray, so that the detection element receives and detects intensity of a diffraction X-ray at a position of the diffraction X-ray; and a stress calculation module, obtaining a strain value based on an intensity peak of the diffraction X-ray detected by the detection element, and calculating a residual stress value of the detection piece by using a formula.

Residual stress detection device and detection method thereof

A sensing device of pressure and temperature in a mold comprises: a housing communicating with a mold cavity, and including a channel and an accommodating space; a base on a bottom surface of the housing, and including a mesa on a top; a strut in the accommodating space, and a front end thereof extended into the channel and exposed to the mold cavity; a strain structure between the mesa and a back end of the strut, and located on the mesa; a strain gage on the strain structure to measure a deformation amount of the strain structure the mold cavity and transforming the deformation amount into deformation amount information; a temperature-sensing element in the strut to measure a temperature of the strut, and transforming the temperature into strut temperature information; and a processing unit to obtain the deformation amount information and the strut temperature information.

Sensing device of pressure and temperature in mold

A radio frequency (RF) positioning system comprises transceivers, positioning tags, processing units and a computing host. One or multiple positioning tags are attached to a target object being located. When the transceivers first generate and transmit transmission signals, one or multiple tag antennas in the positioning tag receive the transmission signals and transmit back modulated signals. The transceivers then receive and transmit the modulated signals to the processing units. The processing units are configured to obtain received signals, and calculate frequency differences based on the received signals and the transmission signals. The computing host calculates position coordinates of tag antennas based on the frequency differences, and then calculates the orientation of the target object being located according to the position coordinates of the tag antennas.

Radio frequency positioning system

An optical measurement system including a two-dimensional sine wave annuls grating and a measurement unit is provided. The two-dimensional sine wave annuls grating includes a rotary shaft and a plurality of sine wave structures surrounding the rotary shaft and continuously arranged. The measurement unit is adapted to output a light beam towards the two-dimensional sine wave annuls grating, wherein each of the sine wave structures is adapted to reflect the light beam from the two-dimensional sine wave annuls grating back to the measurement unit. A measurement method for errors of a rotating platform and a two-dimensional sine wave annuls grating are also provided.

Optical measurement system, measurement method for errors of rotating platform, and two dimensional sine wave annulus grating

A measurement device for a linear stage includes a two-dimensional grating and a measurement unit respectively disposed on first and second moving stages of the linear stage. The measurement unit includes a light source, a two-dimensional sensor and a processor. The light source emits incident light to the two-dimensional grating so that the incident light is reflected thereby to result in reflection light. The two-dimensional sensor receives the reflection light and converts the same to a reflection signal. The processor receives the reflection signal and determines accordingly a first rotational angle, and first and second displacement components of a displacement of the first moving stage.

Measurement device for linear stage

A measuring method for linear stage used for measuring a displacement volume of a linear stage includes a light source, a two-dimensional grating, a quadrant photodiode and a processor. The light source provides an incident light, and the two-dimensional grating is disposed in light path of the incident light and reflects the incident to form a reflection light. The quadrant photodiode is disposed in light path of the reflection light and receives the reflection light for generating a plurality of sensing signals. The processor receives the sensing signals and utilizes the sensing signals to calculate a slope signal by a slope signal equation of the two-dimensional grating and an initial position signal and an end position signal by a position signal equation of the two-dimensional grating. The processor obtains the displacement volume of the linear stage by the slope signal, the initial position signal and the end position signal.

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Kaohsiung, Taiwan

Hsiu-An Tsai