Intel Corporation

Intel Corportation

Hsing-Min Chen

Kuljit Singh Bains

Siddhartha Chhabra

Wei P Chen

Rajat Agarwal

Wei Wu

Ronald Perez

Theodros Yigzaw

Jing Ling

Deep K Buch

John G Holm

Andrew M Rudoff

Sreenivas Mandava

Kjersten E Criss

Manjula Peddireddy

Qiuxu Zhuo

Anthony Luck

Vaibhav Singh

Karthik Ananthanarayanan

John Holm

In one embodiment, an apparatus comprises: a first circuit to compact a plurality of data blocks to a compacted data block and to compact a plurality of error correction codes (ECCs) associated with the plurality of data blocks to a compacted ECC; and a second circuit to generate a generated ECC for the compacted data block. The apparatus may directly send the plurality of data blocks to a destination circuit without error detection on the plurality of data blocks based at least in part on the compacted ECC and the generated ECC. Other embodiments are described and claimed.

System, method and apparatus for reducing power consumption of error correction coding using compacted data blocks

A memory subsystem includes memory devices with space dynamically allocated for improvement of reliability, availability, and serviceability (RAS) in the system. Error checking and correction (ECC) logic detects an error in all or a portion of a memory device. In response to error detection, the system can dynamically perform one or more of: allocate active memory device space for sparing to spare a failed memory segment; write a poison pattern into a failed cacheline to mark it as failed; perform permanent fault detection (PFD) and adjust application of ECC based on PFD detection; or, spare only a portion of a device and leave another portion active, including adjusting ECC based on the spared portion. The error detection can be based on bits of an ECC device, and error correction based on those bits and additional bits stored on the data devices.

Adaptive error correction to improve system memory reliability, availability, and serviceability (RAS)

A write request causes controller circuitry to write an encrypted data line and First Tier metadata portion including MAC data and a first portion of ECC data to a first memory circuitry portion and a second portion of ECC data to a sequestered, second memory circuitry portion. A read request causes the controller circuitry to read the encrypted data line and the First Tier metadata portion from the first memory circuitry portion. Using the first portion of the ECC data in the First Tier metadata portion, the controller circuitry determines if an error exists in the encrypted data line. If no error is detected, the controller circuitry decrypts and verifies the data line using the MAC data in the First Tier metadata portion. If an error in the data line is detected, the Second Tier metadata portion, is fetched from the sequestered, second memory circuitry portion and the error corrected.

Memory in integrity performance enhancement systems and methods

Growing community of inventors

Santa Clara, CA, United States of America

Hsing-Min Chen