Industrial Technology Research Institute

Innovative Nanotech Incorporated

Hsin-Chia Ho

Wei-En Fu

Yen-Liang Lin

Wen-Li Wu

Guo-Dung Chen

Yen-Song Chen

Yun-San Chien

An apparatus for mixing a solution includes first and second tanks, a sampling element, a flow control element and a mixing assembly is provided. The first tank has a first chamber and a first fluid inlet. The second tank has a second chamber. The sampling element is connected and communicated with the first chamber. The flow control element connects and communicates with the first chamber through the first fluid inlet. Two opposite ends of the mixing assembly connect and communicate with the first chamber and the second chamber, respectively.

Apparatus for mixing solution

The disclosure provides an apparatus for aligning first and second plates that are parallel to each other and have the same orientation. The apparatus includes a detector that detects composite small-angle X-ray scattering emitted from patterns of the first and second plates that are perpendicularly impinged by X-ray, and a moving unit that aligns the first and second plates according to a composite amplitude distribution of the composite small-angle X-ray scattering. Therefore, the first and second plates are aligned to each other accurately.

Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements

An apparatus for mixing a solution includes first and second tanks, a sampling element, a flow control element, a mixing assembly, first and second air-intake systems, and first and second air-exhaust systems. The first tank has a first chamber. The second tank has a second chamber. The sampling element has an extraction port located in the first chamber. The flow control element connects and communicates with the first chamber. Two opposite ends of the mixing assembly connect and communicate with the first chamber and the second chamber, respectively. The first air-intake system and the first air-exhaust system connect and communicate with the first chamber. The second air-intake system and the second air-exhaust system connect and communicate with the second chamber.

System and method for monitoring particles in solution

An apparatus and methods for small-angle electron beam scattering measurements in a reflection or a backscattering mode are provided. The apparatus includes an electron source, electron collimation optics before a sample, electron projection optics after the sample, a sample stage capable of holding the sample, and a electron detector module. The electrons emitted from the source are collimated and positioned to impinge nanostructures on the sample. The signals resulting from the interactions between the impinging electrons and the nanostructures are further magnified by the electron projection optics to reach a sufficient angular resolution before recorded by the electron detector module.

Growing community of inventors

Hsinchu County, Taiwan

Hsin-Chia Ho