Texas Instruments Corporation

Hsiao-Yuan Li

Rex Alan Naden

Gene D Lee

Alvis D Stephenson, Jr

Method and apparatus for testing and setting the field strength of permanent magnets in a magnetic bubble domain chip module, wherein the final molded module is formed to contain a pair of longitudinal slots which run through the module on opposite sides thereof. The module is inserted, via said slots, onto conducting members of a magnetic bubble module testing apparatus. The conducting members effectively provide one turn coils on each side of the module. Current is induced in these coils in such a way as to either add to or subtract from the bias field provided for the magnetic bubble domain chip by the permanent magnets of the module. The module is tested to determine the upper and lower operating levels of the bias field for effective operation of the chip, and the device is remagnetized to set the bias field of the module in the center, or optimal point, of the bias margin.

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Dallas, TX, United States of America

Hsiao-Yuan Li