Other

Celerint, LLC.

Howard Roberts

Craig Spradling

A system for connecting a test pin of automatic test equipment (ATE) to devices for testing includes a first handler for manipulating a first portion of the devices and a second handler for manipulating a second portion of the devices. The system includes a first socket for testing devices of the first portion, which is connected to a first wire, and a second socket for testing devices of the second portion, which is connected to a the second wire. A controller multiplexes the two handlers, or dual manipulators of a single handler, to operate the handlers asynchronously in coordination with testing, such that while the ATE is testing devices for one handler, the other handler presents next devices to the ATE for immediate switch of testing between devices for each handler. The system is suitable for conventional handlers and ATE.

Muxing interface platform for multiplexed handlers to reduce index time system and method

A system for communicatively connecting devices for testing to respective test pins of a test head of an automatic test equipment (ATE). The system includes a tester interface device for communicative connection to the test pins of the ATE. The tester interface device includes a first connector and a second connector. The first connector is communicatively connected by the tester interface device to a first group of the test pins and the second connector is communicatively connected by the tester interface device to a second group of the test pins. The first group and the second group can be different test pins, same test pins, or combinations of some same and some different test pins. The system may also include a first pogo pin block device and a second pogo pin block device.

Universal multiplexing interface system and method

A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via parallel connections, to either one of dual sockets at each instant of testing. The handler has first and second manipulator arms. Each arm operates as to a particular one of the respective sockets, to retrieve a next device to be tested and position the device in the socket (while testing is performed on a device in the other socket), to disposition the device from the socket once testing is completed as to the device in the socket, and thereafter repeat until all staged devices for testing have been tested (or an interruption of testing otherwise occurs). The mux relay switches between sockets in response to the tandem handler acting as a master and the tester as slave. Upon completion of testing via the test resource as to an applicable pin of one socket, the test resource is switchably connected via the mux relay to a functionally same applicable pin of the other socket.

Tandem handler system and method for reduced index time

A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via parallel connections, to either one of dual sockets at each instant of testing. The handler has first and second manipulator arms. Each arm operates as to a particular one of the respective sockets, to retrieve a next device to be tested and position the device in the socket (while testing is performed on a device in the other socket), to disposition the device from the socket once testing is completed as to the device in the socket, and thereafter repeat until all staged devices for testing have been tested (or an interruption of testing otherwise occurs). The mux relay switches between sockets in response to the tandem handler acting as a master and the tester as slave. Upon completion of testing via the test resource as to an applicable pin of one socket, the test resource is switchably connected via the mux relay to a functionally same applicable pin of the other socket. The tandem handler controls the mux and test commencement by test result/end-of-test signals. The tandem handler logically and mechanically operates itself, the mux relay, and the tester logically and functionally for the dual socket arrangement. Control/master of the tester by the tandem handler allows for negligible index time and reduced downtime of testing. Certain handler elements, such as transports, stages, and so forth, are duplicated along dual test progression paths for respective sockets. Other elements, including logic and control, are common for the dual paths.

A system for testing with an automated test equipment (ATE) includes a tester having first and second manipulator arms. The tester has a pin electronics card. The pin electronics card includes a tester channel for connecting to a single pin of a device under test. The pin electronics card also includes a muxing relay connected to the tester channel, a first lead of the muxing relay, for connecting to a single pin of a first device under test, and a second lead of the muxing relay, for connecting to a single pin of a second device under test. The muxing relay electrically switches from testing of the first device under test to testing of the second device under test, and vice versa. respectively, with negligible index time.

Pin electronics implemented system and method for reduced index time

A system for testing with an automated test equipment (ATE). The ATE includes a tester, an interface board connected to the tester, a first socket and a second socket of the interface board, a first manipulator arm connected to the tester, and a second manipulator arm connected to the tester. The first socket and the second socket are parallel-wired to the tester. The ATE also includes a switch connected to the tester and the interface board. The switch selectively effects communicative connection of the tester to either of the first socket or the second socket at each instant. During testing via one of the sockets, one of the manipulator arms moves post-test devices and replaces next devices for testing in the other of the sockets. After testing via one of the sockets is completed, the switch immediately connects the other socket and testing of next devices commences and continues for those devices. The system continuously repeats the movement and replacing of devices in each respective socket during testing of devices at the other socket. Index time for testing with the system is substantially negligible.

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Austin, TX, United States of America

Howard Roberts