Analog Devices,inc.

Other

Howard R Samuels

Michael W Judy

Thomas W Kelly

David C Hollocher

James M Lee

Jeffrey A Farash

Xin Zhang

Harvey Weinberg

Alain Valentin Guery

Thor N Juneau

Brian Moss

Kevin H-l Chau

Long Pham

Scott H Wayne

Christophe Lemaire

Joseph Wayne Palmer

Kevin H-L Chau

A state of one or more fuses can be determined using a common-gate FET device to read reference information and test information from a fuse bank. In an example, the FET device can be selectively diode-connected using a first switch that responds to a control signal, and a signal-storing capacitor can be connected to the gate terminal of the FET device. The capacitor can store information about a reference signal when the first switch is closed and a first input signal is applied at a source node of the FET device. When the first switch is open, a second input signal can be applied at the source node of the FET device, and an output signal at the drain node of the FET device can indicate a magnitude relationship between the first input signal and the reference signal. In an example, the second input signal can indicate a state of a fuse.

Common-gate comparator and fuse reader

According to some aspects, a low-leakage switch is provided. In some embodiments, the low-leakage switch includes a plurality of pass transistors in series that selectively couple two ports of the low-leakage switch and a node biasing circuit coupled to a node between the plurality of pass transistors. In these embodiments, the node biasing circuit may adjust a voltage at the node to change the gate-to-source voltage of the pass transistors and, thereby, reduce the leakage current through the pass transistors when the low-leakage switch is turned off. The node biasing circuit may also include circuitry to reduce the leakage current introduced by the node biasing circuit into the node when the low-leakage switch is turned on.

Electronic switch exhibiting low off-state leakage current

An amplifier system has an amplifier for amplifying a plurality of input signals from a plurality of different channels, and a plurality of demodulators each operatively coupled with the amplifier for receiving amplified input signals from the amplifier. Each demodulator is configured to demodulate a single amplified input channel signal from a single channel of the plurality of different channels. The system thus also has a plurality of filters, coupled with each of the demodulators, for mitigating the noise.

Low noise amplifier for multiple channels

A single-axis tilt-mode microelectromechanical accelerometer structure. The structure includes a substrate having a top surface defined by a first end and a second end. Coupled to the substrate is a first asymmetrically-shaped mass suspended above the substrate pivotable about a first pivot point on the substrate between the first end and the second end and a second asymmetrically-shaped mass suspended above the substrate pivotable about a second pivot point on the substrate between the first end and the second end. The structure also includes a first set of electrodes positioned on the substrate and below the first asymmetrically-shaped mass and a second set of electrodes positioned on the substrate and below the second asymmetrically-shaped mass.

Tilt mode accelerometer with improved offset and noise performance

A hearing instrument has a plurality of electronic components within a body, and an inertial sensor mechanically coupled with the body. The inertial sensor is configured to monitor the motion of the body and generate a movement signal representative of the body motion. A controller operatively coupled with the inertial sensor controls power usage by at least one or more of the electronic components as a function of the movement signal.

Hearing instrument controller

A MEMS device has a movable beam, a differential capacitor with a movable electrode that moves in response to the displacement of the movable beam and that is disposed between two stationary electrodes, and a voltage circuit for applying a first voltage to the first stationary electrode, second voltage to the second stationary electrode, and a third voltage to the moveable electrode. The MEMS device also has a monitor operably coupled with the movable beam to monitor the displacement of the movable beam. In some embodiments, the monitor may monitor the distance between the movable electrode and at least one of the stationary electrodes. The MEMS device further has a voltage reducing circuit operatively coupled with the monitor, the movable electrode, and the stationary electrodes. The voltage reducing circuit reduces the differential between the third voltage and the voltages on the stationary electrodes when the monitor detects that the displacement of the movable beam is greater than or equal to a threshold value.

Anti-capture method and apparatus for micromachined devices

An apparatus and method of testing one-time-programmable memory provides one-time-programmable memory having one or more memory locations for storing data and corresponding programming circuitry for each memory location. In addition, each programming circuitry has a circuit element configured to permanently change state to store the data in the memory. The method also reads each memory location to verify that the memory location is unprogrammed and activates the programming circuitry for each memory location, which applies a test current to the programming circuitry. The test current is less than a threshold current needed to permanently change the state of the circuit element. The method then determines whether the programming circuitry is functioning properly.

Built-in self test for one-time-programmable memory

An apparatus and method of testing one-time-programmable memory limits current through a one-time-programmable memory to less than a threshold amplitude, where the memory has a fuse configured to blow upon receipt of a signal having the threshold amplitude. The method also uses blow signal assertion circuitry to attempt to assert a blow signal to the fuse. When not defective, blow signal assertion circuitry is configured to permit the low amplitude signal to flow through the fuse when the fuse is not blown and the blow signal is asserted. The method then produces an output signal having a success value if the limited current flows through the fuse, and a failure value if the current does not flow through the fuse.

Apparatus and method for testing one-time-programmable memory

A system, computer program product and method of obtaining a performance parameter associated with a sensor, such as an accelerometer, is provided. The method includes applying an acceleration to the accelerometer and a first frequency to obtain a sensitivity of the accelerometer at the first frequency. A first self-test is performed on the accelerometer. The first self-test includes stimulating the accelerometer with a first self-test stimulation signal encoded with the first frequency, such that the accelerometer outputs a first signal. A self-test equivalent acceleration is then determined based, at least in part, on the first signal and the accelerometer sensitivity at the first frequency. A second self-test is performed on the accelerometer. The second self-test includes stimulating the accelerometer with a second self-test stimulation signal encoded with the second frequency, such that the accelerometer outputs a second signal. A parameter of the accelerometer is determined at the second frequency based, at least in part, on the second signal and the self-test equivalent acceleration. The parameter may be sensitivity of the accelerometer at the second frequency.

Sensor self-test transfer standard

A MEMS device has a movable beam, a differential capacitor with a movable electrode that moves in response to the displacement of the movable beam and that is disposed between two stationary electrodes, and a voltage circuit for applying a first voltage to the first stationary electrode, second voltage to the second stationary electrode, and a third voltage to the movable electrode. The MEMS device also has a monitor operably coupled with the movable beam to monitor the displacement of the movable beam. In some embodiments, the monitor may monitor the distance between the movable electrode and at least one of the stationary electrodes. The MEMS device further has a voltage reducing circuit operatively coupled with the monitor, the movable electrode, and the stationary electrodes. The voltage reducing circuit reduces the differential between the third voltage and the voltages on the stationary electrodes when the monitor detects that the displacement of the movable beam is greater than or equal to a threshold value.

A method and system for determining camera positioning information from an accelerometer mounted on a camera. The accelerometer measures the orientation of the camera with respect to gravity. Orientation measurement allows user interface information to be displayed in a 'right side up' orientation on a viewfinder for any camera orientation. Alternatively, an artificial horizon indicator may be displayed in the viewfinder. The accelerometer may also measure camera movement. Camera movement information together with camera orientation can be used to determine camera usage. Additionally, camera movement information can be used to determine a minimum shutter speed for a sharp picture.

Camera with acceleration sensor

In an inertial sensor, a mass is supported by a number of mass support structures positioned within an inner periphery of the mass. The mass support structures are affixed to a substrate by at least one anchor positioned proximate to the mass' center of mass. A number of sensing fingers are affixed to the mass support structures.

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Newton, MA, United States of America

Howard R Samuels