Siemens Aktiengesellschaft

Omicron Electronics Gmbh

Hossein Borsi

Stefan Nowak

Arthur Kaindl

Michael Krüger

Ernst Gockenbach

Method and device for measuring a dielectric response of an electrical insulating system, wherein a first measurement result is determined by a frequency domain method and a second measurement result is determined by a time domain method, whereupon the first measurement result and the second measurement result are combined to form an overall measurement result as the dielectric response. Standard types of measurement methods, for example the FDS and PDC methods, may be used as measurement methods for the frequency domain and the time domain.

Method and apparatus for measuring a dielectric response of an electrical insulating system

A method for determining sources of interference that cause partial discharges in an encapsulated conductor structure of a magnetic resonance apparatus, particularly in a gradient coil. Under the method, a low-frequency high voltage is applied to a conductor, and signals resulting from an adjacent high voltage are measured within a frequency range located in the kHz range, particularly from 40 to 400 kHz. The signals are analyzed in order to determine partial discharges. The conductor is again charged with a low-frequency high voltage and additional signals are measured within a frequency range located in the MHz range, particularly from 10 to 300 MHz. The additional signals are analyzed in order to determine partial discharges.

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Hannover, Germany

Hossein Borsi