Average Co-Inventor Count = 3.10
ph-index = 3
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Korea Advanced Institute of Science and Technology (15 from 2,632 patents)
2. The Boeing Company (4 from 22,301 patents)
3. Samsung Electronics Co., Ltd. (1 from 132,080 patents)
4. Samsung Display Co., Ltd. (1 from 27,229 patents)
5. Kia Motors Corporation (1 from 8,090 patents)
6. Poongsan Fns Corporation (1 from 1 patent)
20 patents:
1. 12487208 - Method for detecting fatigue crack in structure using long short-term memory network-based spectral noise reduction and nonlinear ultrasonic modulation, and system therefor
2. 12209935 - Method of estimating displacement of a bridge and an electronic device to estimate displacement of a bridge
3. 12046167 - Apparatus for inspecting a display panel for defects
4. 11858040 - Method of inspecting printing quality of 3D printing object using femtosecond laser beam during 3D printing process, and apparatus and 3D printing system for the same
5. 11815447 - Femtosecond laser-based ultrasonic measuring apparatus for 3D printing process and 3D printing system having the same
6. 11628502 - Method of feedback controlling 3D printing process in real-time and 3D printing system for the same
7. 11590579 - Method and apparatus for estimating depth of molten pool during printing process, and 3D printing system
8. 11494891 - Method of inspecting and evaluating coating state of steel structure and system therefor
9. 11484945 - Method of feedback controlling 3D printing process in real-time and 3D printing system for the same
10. 11371839 - Method of performing visualized measurement on thickness distribution of paint film and apparatus therefor
11. 11131651 - Method of inspecting structure and inspection system
12. 10508970 - System for precision measurement of structure and method therefor
13. 10222354 - Non-contact durability diagnosis apparatus and method
14. 9772315 - Wireless diagnosis apparatus for structure using nonlinear ultrasonic wave modulation technique and safety diagnosis method using the same
15. 9500599 - Surface inspection apparatus for semiconductor chips