Samsung Electronics Co., Ltd.

Hoon Sin

Sang-Uhn Cha

Ye-Sin Ryu

In-Woo Jun

Hyun-Gi Kim

Seung-Jun Lee

Seung-Jun Shin

Seong-Jin Cho

Ju-seong Hwang

Ik-Joon Choi

A semiconductor memory device includes a memory cell array, an error correction code (ECC) engine, a refresh control circuit, a scrubbing control circuit and a control logic circuit. The refresh control circuit generates refresh row addresses for refreshing a memory region on memory cell rows in response to a first command received from a memory controller. The scrubbing control circuit counts the refresh row addresses and generates a scrubbing address for performing a scrubbing operation on a first memory cell row of the memory cell rows whenever the scrubbing control circuit counts N refresh row addresses of the refresh row addresses. The ECC engine reads first data corresponding to a first codeword, from at least one sub-page in the first memory cell row, corrects at least one error bit in the first codeword and writes back the corrected first codeword in a corresponding memory location.

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

Semiconductor semiconductor memory devices, memory systems and methods of operating memory devices

A memory device includes a memory cell array, a refresh controller, and control logic. The memory cell array includes a plurality of rows. The refresh controller performs a refresh operation on the plurality of rows. The control logic controls a care operation on a first adjacent region that is most adjacent to a first row based on a number of times the plurality of rows are accessed during a first period. The control logic also controls a care operation on a second adjacent region that is second adjacent to a second row based on a number of times the plurality of rows are accessed during a second period. The first and second periods are different periods.

Memory device performing care operation for disturbed row and operating method thereof

A memory module includes data memories and at least one parity memory. Each of the data memories includes a first memory cell array with a first memory region to store data set corresponding to a plurality of burst lengths and a second memory region to store first parity bits to perform error detection/correction associated with the data set. The at least one parity memory includes a second memory cell array with a first parity region to store parity bits associated with user data set corresponding to all of the data set stored in each of the data memories and a second parity region to store second parity bits for error detection/correction associated with the parity bits.

Memory modules, memory systems including the same and methods of operating memory systems

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Hwaseong-si, South Korea

Hoon Sin