Analog Devices,inc.

Analog Devices Global

Analog Devices International Unlimited Company

Analog Devices Global Unlimited Company

Hongxing Li

Michael C W Coln

Michael Mueck

Christopher Peter Hurrell

Jesper Steensgaard-Madsen

Niall Kevin Kearney

Keith Anthony O'Donoghue

Colin Gerard Lyden

Damien Joseph McCartney

Junhua Shen

Sanjay Rajasekhar

Roberto Sergio Matteo Maurino

David Paul Foley

Tsutomu Wakimoto

Damien Mccartney

Techniques for determining a state of health of an energy storage device that utilize a capacitor gain amplifier to provide an AC gain and block the DC voltage. An input capacitor can couple between an input excitation signal generator circuit and the amplifier's inverting input terminal, and a feedback capacitor can couple between the amplifier's inverting input terminal and the amplifier's output. A switch can be used to reset the feedback capacitor periodically to prevent the amplifier's output from becoming saturated from a leakage current at the inverting input terminal of the amplifier.

Techniques for determining energy storage device state of health

The techniques of this disclosure can cancel or reduce the kT/C noise directly before the gain stage. The effect of the kT/C noise can be greatly reduced, allowing both lower noise conversion and smaller sampling capacitors, which can reduce the die area and reduce the power consumption of the ADC.

Low noise integrated circuit techniques

Comparator input noise or offset suppression can include an error detector circuit that can operate in a feedback loop, such as during an autozero phase. The error detector circuit can include a time-varying filter response to improve accuracy and convergence time. The comparator can be used in a successive approximation routine (SAR) or other analog-to-digital converter (ADC) circuit, such as to control a digital-to-analog converter (DAC), such as can be used to adjust a tuning circuit within the comparator to compensate for noise or offset. The DAC can be combined with a DAC used for carrying out SAR bit-trials or bit decisions.

Comparator error suppression

Noise sources in an ADC circuit can include kT/C noise of a sampling capacitor, noise coupling on to sampling capacitors from digital circuits, and amplifier noise. Also, charge injection from mismatch in sample switches can cause offsets. These various noise sources can be largely canceled or reduced using described techniques. As a result, the size of the sampling capacitors can be greatly reduced, while still achieving significantly improved noise performance and power efficiency for the overall converter.

Low noise analog-to-digital converter

Various background calibration techniques to calibrate inter-stage gain, e.g., in pipelined ADCs, are described to allow open loop amplifier circuits to be used as residue amplifiers for better power efficiency. Using various techniques, a well-controlled perturbation can be injected between two conversions and the actual perturbation after a residue amplifier can be measured. By comparing the actual measurement against an expected value, the gain information of the residue amplifier can be estimated and then calibration can be applied.

Inter-stage gain calibration in double conversion analog-to-digital converter

Techniques that allow application of noise-shaped dither without applying dither at sampling, resulting in the analog-to-digital converter (ADC) circuit advantageously being balanced during acquisition. Balancing the ADC circuit at acquisition can reduce the risk of sampling digital interferences that can couple in through the references or substrates.

Analog-to-digital converter with noise-shaped dither

A higher accuracy ADC circuit (e.g., in which the number of bits of the ADC circuit is twelve or greater) may need calibration multiple times during its working life to avoid bit weight errors. Described are techniques to address DAC element ratio errors between DAC element clusters in a DAC circuit in order to maintain the linear performance of analog-to-digital converter (ADC) circuits and digital-to-analog converter (DAC) circuits.

Digital-to-analog converter with improved linearity

Various techniques that can provide a capability to background calibrate ADC linearity error, e.g., due to capacitor mismatch drift and other parameter drift, during normal ADC operation in which analog-to-digital signal conversions are ongoing. A method can include grouping capacitors of an ADC into multiple clusters and calibrating under an arbitrary signal condition. To quickly converge the calibration result, the same arbitrary signal can be converted twice, and the capacitor(s) being calibrated can be modulated after first conversion. The difference between the results of the first and second conversions can contain the error information that can be used for calibration, and the signal component can be removed by this process. These techniques can provide improved linearity at 20-bit level and beyond.

Analog to digital converter with background calibration techniques

An analog-to-digital converter (ADC) circuit including error correction circuitry for correcting offset drifts in an ADC, such as a successive approximation register (SAR) ADC. The offset drifts can be reduced, such as by sampling the offset following an analog-to-digital conversion and subsequently providing an error correction signal based on the sampled offset.

Analog-to-digital converter with offset calibration

An analog to digital converter (ADC) system includes two signal paths in parallel with each other, where the signal paths include separate ADC circuits to separately operate on a same input signal and output separate digital signals. A difference signal is calculated as a difference of the digital signals output from the two signal paths to determine an error present in one or both of the signal paths. The error may be modulated in one or both of the signal paths and demodulated from the difference signal according to a same digital modulation pattern to compute an error compensation signal to compensate for at least one of the modulated error and a secondary error resulting from the modulation of the error.

Systems and methods for removing errors in analog to digital converter signal chain

An analog-to-digital converter (ADC) system can sample an input voltage for at least a first conversion into a first N-bit digital value and to use the same input voltage sample for at least a second conversion into a second N-bit digital value. A difference between a result of the first conversion and a result of the second conversion can be driven toward zero to adjust weights of one or more of the bits to calibrated values for use in one or more subsequent analog-to-digital conversions of subsequent samples of the input voltage. Shuffling, dithering, or the like can help ensure that at least a portion of the decision paths used in the second conversion are different from the decision paths used in the first conversion. Calibration can be performed in the background while the the ADC is converting in a normal mode of operation.

ADC background calibration with dual conversions

A dynamically tunable transconductor includes a voltage-to-current converter stage for generating a current signal based on a voltage signal; and a current scaling stage for scaling the current signal by a scaling factor to achieve a particular transconductance. Current scaling stage includes a coarse tune mechanism having an associated coarse tune step and a fine tune mechanism having an associated fine tune step, where the scaling factor is a ratio of the coarse tune step to the fine tune step. A delta-sigma modulator can implement the transconductor to generate loop filter coefficients by dynamically tuning the transconductance to achieve a particular resistance.

Delta-sigma modulator having transconductor network for dynamically tuning loop filter coefficients

An analog to digital convertor (ADC) comprises an integrator having an input selectively connected to an intermediate frequency (IF) signal input and an output connected to a summer. The summer has an output connected to an input of a quantizer, the quantizer output being operatively connected to a signal strength indicator. The integrator includes a programmable gain feedback component. The summer has a synthesized calibration signal input, the value of the programmable gain feedback component being configured to vary when a synthesized calibration signal at the intermediate frequency is applied to the summer. The signal strength indicator is configured to detect a value of the programmable gain feedback component when the signal strength is minimized and to calibrate the ADC accordingly.

Analog to digital convertor and a method of calibrating same

Apparatus and methods for voltage comparison are provided. In one embodiment, a comparator includes a first input transistor having a gate configured to receive a first input voltage and a second input transistor having a gate configured to receive a second input voltage. The first and second input transistors can be used to compare the first input voltage to the second input voltage. Additionally, the comparator further includes a first Miller capacitor electrically connected to a drain of the first input transistor and a second Miller capacitor electrically connected to a drain of the second input transistor. Furthermore, first and second inverting amplification circuits are electrically connected across the first and second Miller capacitors, respectively, so as to increase the effective capacitance of the capacitors. The first and second Miller capacitors can be used to extend the comparator's integration time, thereby enhancing the performance of the comparator.

Apparatus and methods for voltage comparison

A voltage converter circuit can include a boost converter having a switching transistor and configured to receive an input voltage, produce an output voltage and selectively operate in one of a boost mode, a skip mode and a linear mode. In the boost and skip modes, the boost converter can switch on and off the switching transistor at a switching frequency to produce an output voltage at magnitudes greater than input voltage magnitudes. In the linear mode, the boost converter can turn off the switching transistor at all times to pass the input voltage unboosted to produce an output voltage at magnitudes less than input voltage magnitudes. The boost converter can be configured to operate in the boost mode for input voltage magnitudes less than a first predetermined input voltage magnitude, in the skip mode for input voltage magnitudes between the first predetermined magnitude and a second predetermined input voltage magnitude greater than the first predetermined input voltage magnitude, and in the linear mode for input voltage magnitudes greater than the second predetermined input voltage magnitude.

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Andover, MA, United States of America

Hongxing Li