Boe Technology Group Co., Ltd.

Ordos Yuansheng Optoelectronics Co., Ltd.

Hongxia Yang

Guoqing Zhang

Xiaowei Wang

Weifeng Wang

Ke Zhao

Pucha Zhao

Hongwei Gao

Yaorong Liu

Zhihui Jia

Yan Zong

Longfei Yang

Meili Guo

Feiwen Tian

Lei Wang

Xiaopeng Bai

Yu Fu

Zhixin Guo

Xuepeng Ji

Ming Wang

Peng Chen

Tao Yang

Wei Song

Yi Qu

Jie Wu

Lin Liu

Ling Tong

Xuan Zhang

Shanshan Bao

Tianyu Xu

Haotian Chen

Yonghong Zhang

Yanbin Dang

Zenghong Li

Tuan Liang

Xingliang Wang

Sungho Kim

Zhigang Sun

Chenwei Wang

A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Test circuitry and method for testing the same, test system

The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.

Method and system for aging process on transistors in a display panel

A defect detection circuit and a defect detection method for a light-emitting element, a display driving device, a display device, and a defect detection method for the display device are provided. The defect detection circuit includes a power source signal adjustment sub-circuit, a data signal adjustment sub-circuit, a first initial signal adjustment sub-circuit, a second initial signal adjustment sub-circuit and a storage capacitor connected to a control end of a driving transistor. The storage capacitor is configured to control the driving transistor to be turned off under the effect of a power source signal, a data signal and an initial signal, to enable the second initial signal adjustment sub-circuit to apply the initial signal to a light-emitting sub-circuit, thereby to enable the light-emitting sub-circuit to emit light. The display driving device includes the defect detection circuit.

Defect detection circuit and method for light-emitting element, display driving device, display device and defect detection method thereof

A display substrate includes: a display driving signal line; and at least one set of testing pads, wherein each set of the testing pads includes: a plurality of light-on testing pads arranged successively and connected to the display driving signal line; and two pin-miss testing pads electrically connected to one another while not connected to the display driving signal line.

Display substrate, light-on device and method for testing alignment of light-on testing pin

A detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device are provided. The detecting apparatus includes: an illuminating device for sequentially illuminating a plurality of detection regions of a screen of the AMOLED display device, the screen being divided into the plurality of detection regions, each of the detection regions including at least one light-emitting unit; a current detecting device for acquiring a detection current which is a sum of driving currents of the light-emitting unit in the detection region being illuminated; and a judging device for judging whether the detection region corresponding to the detection current is a defective region according to the detection current. The apparatus can detect luminance uniformity of the AMOLED display device. The detection efficiency is high, the detection standard is unified and the detection accuracy is high.

Detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device

A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Capacitor detection method and pixel driving circuit

The present disclosure relates to a power supply device for a display panel, a manufacturing method, a power supplying method, and a display device. The power supply device may include: a first line surrounding the display panel and electrically connected to sub-pixels of the display panel; at least one first power supply terminal disposed at a first side of the display panel and connected to a first line segment of the first line located at the first side of the display panel; at least one second power supply terminal connected to a second line segment of the first line located at a second side of the display panel to compensate for a voltage drop of the first power supply terminal on the first line. The first side and the second side of the display panel are opposite sides of the display panel.

Power supply device for display panel, manufacturing method, power supplying method and display device

The present disclosure provides a signal loading method and a signal generator. The signal loading method includes: loading a first pair of voltage signals to at least one pair of separate signal channels for a time period, respectively, wherein the first pair of voltage signals have a first voltage difference therebetween; and determining whether a short circuit occurs in the at least one pair of signal channels within the time period, and if it is determined that no short circuit occurs in the at least one pair of signal channels within the time period, loading a second pair of voltage signals having a second voltage difference therebetween to the at least one pair of signal channels at the end of the time period. The second voltage difference is greater than the first voltage difference.

Signal loading method and signal generator

A method and an apparatus are provided for detecting and classifying an active matrix organic light emitting diode panel. The method includes: comparing images to be compared which are collected from the active matrix organic light emitting diode panel with template images in a preset template image library; classifying the active matrix organic light emitting diode panel depending on results of the comparing.

Method and apparatus for detecting and classifying active matrix organic light emitting diode panel

Growing community of inventors

Beijing, China

Hongxia Yang