International Business Machines Corporation

Hongqing Zhang

Jay A Bunt

David J Lewison

Joyce E Molinelli Acocella

Jeffrey Allen Zitz

Frank Louis Pompeo

Shidong Li

Christopher Vincent Jahnes

John Michael Cotte

Minhua Lu

James A Busby

Junjun Li

Madhana Sunder

Nils D Hoivik

Zhigang Song

Guoda Lian

Michael J Ellsworth, Jr

Levi A Campbell

Hilton T Toy

Sushumna Iruvanti

Yu Luo

Kenneth Charles Marston

Allan C VanDeventer

Arthur J Higby

Steven H Boettcher

Philipp K Buchling Rego

Heather Nicole Polgrean

A device that comprises an outer component, an inner component and a filter module. The outer component includes a first hollow cylinder, and exterior ports in sidewalls of the first hollow cylinder. The inner component is positioned coaxially within the first hollow cylinder, and includes a second cylinder, and interior ports in the second cylinder, wherein the interior fluid ports are aligned parallel to the exterior ports. The filter module includes a hollow prism positioned coaxially within the outer component and surrounding the inner component, the hollow prism comprising at least four faces configured to retain filters. The filter module also includes vanes positioned along edges connecting the at least four faces and forming seals with the first hollow cylinder. A first filter is provided on a first face, of the at least four faces, which is aligned between a pair of the interior and exterior ports.

Filter device having multiple changeable filter surfaces

A flexible circuit substrate that includes a conductive line on a flexible substrate and at least one slot in the conductive line on the flex substrate, where at one slot is in an area of the flexible circuit substrate that will be bent to prevent an open in the conductive line on the flexible substrate.

Flexible circuit structure for circuit line bending

Apparatuses and methods of fabrication are provided which include a coolant-cooled heat sink through which coolant passes to facilitate cooling the coolant-cooled heat sink, and an ultra-violet (UV) light assembly associated with the coolant-cooled heat sink for directing UV light towards an interior surface of the coolant-cooled heat sink across which the coolant passes. The UV light inhibits bacterial growth at the interior surface of the coolant-cooled heat sink.

Coolant-cooled heat sink(s) with associated ultra-violet light assembly

Tamper-respondent assemblies are provided which include a circuit board, an enclosure assembly mounted to the circuit board, and a pressure sensor. The circuit board includes an electronic component, and the enclosure assembly is mounted to the circuit board to enclose the electronic component within a secure volume. The enclosure assembly includes a thermally conductive enclosure with a sealed inner compartment, and a porous heat transfer element within the sealed inner compartment. The porous heat transfer element is sized and located to facilitate conducting heat from the electronic component across the sealed inner compartment of the thermally conductive enclosure. The pressure sensor senses pressure within the sealed inner compartment of the thermally conductive enclosure to facilitate identifying a pressure change indicative of a tamper event.

Tamper-respondent assemblies with porous heat transfer element(s)

Aspects of the invention include a non-destructive bond line thickness measurement of thermal interface material on silicon packages. A non-limiting example computer-implemented method includes receiving a chip mounted on a laminate and depositing a high-density material on the chip. The computer-implemented method deposits a thermal interface material on the chip and lids the chip, and the laminate with a lid. The computer-implemented method X-rays the lid, the chip, and the laminate to produce an X-ray and measures, using a processor, from the X-ray a bond line thickness of the TIM as a distance from a bottom of the lid to a top surface of the high-density material.

Non-destructive bond line thickness measurement of thermal interface material on silicon packages

An electronic apparatus that includes a semiconductor device; an electronic packaging substrate for receiving the semiconductor device; a thermal interface material on the semiconductor device; and a lid in contact with the thermal interface material and having a zone of targeted flexibility spaced from the semiconductor device.

Lid/heat spreader having targeted flexibility

Tamper-respondent assemblies are provided which include a circuit board, an enclosure assembly mounted to the circuit board, and a pressure sensor. The circuit board includes an electronic component, and the enclosure assembly is coupled to the circuit board to enclose the electronic component within a secure volume. The enclosure assembly includes an enclosure with a sealed inner compartment, and a structural material within the sealed inner compartment of the enclosure. The structural material within the enclosure inhibits deflection of the enclosure due to a pressure differential between pressure of the sealed inner compartment and pressure around, at least in part, the enclosure. The pressure sensor senses pressure within the sealed inner compartment of the enclosure to facilitate identifying a pressure change indicative of a tamper event.

Tamper-respondent assembly with structural material within sealed inner compartment

An integrated circuit (IC) device package includes an IC device connected to an upper surface of the IC device carrier. Due to operation conditions or IC device package makeup, the IC device may warp. The warped IC device may include a convex upper surface. A conformable lid is connected to the IC device and includes an internal chamber and a deformable floor. The deformable floor is able to deform or bend along with the IC device. After deformation, the deformable floor may include a concave lower surface. A uniform bond line thickness of a thermal interface material that connects the IC device and the conformable lid is able to be achieved due to the deformable floor deforming or bending along with the IC device.

Conformal integrated circuit (IC) device package lid

Coolant-cooled heat sinks and methods of fabrication are provided with a coolant-carrying compartment between a cover and a heat transfer base. The heat transfer base includes a heat transfer surface to couple to a component to be cooled, and a plurality of thermally-conductive fins extending into the coolant-carrying compartment from a surface of the heat transfer base opposite to the heat transfer surface. One or more grooves are provided in an interface surface of the cover and fins, and wicking element(s) are positioned within, at least in part, the groove(s). A joining material is provided between the cover and fins to join the plurality of thermally-conductive fins to the cover. The wicking element(s) within, at least in part, the groove(s) facilitate retaining the joining material over the plurality of thermally-conductive fins during joining of the cover and fins.

Coolant-cooled heat sinks with internal thermally-conductive fins joined to the cover

Methods of producing coolant-cooled heat sinks with a coolant-carrying compartment between a cover and a heat transfer base are provided. The heat transfer base includes a heat transfer surface to couple to a component to be cooled, and a plurality of thermally-conductive fins extending into the coolant-carrying compartment from a surface of the heat transfer base opposite to the heat transfer surface. The method includes positioning a screen with openings over the plurality of thermally-conductive fins, between the plurality of thermally-conductive fins and the cover, and providing a joining material over the screen, between the screen and the cover. The method also includes joining the plurality of thermally-conductive fins to the cover across the screen using the joining material, where the screen facilitates retaining the joining material over the plurality of thermally-conductive fins during the joining.

Fabricating coolant-cooled heat sinks with internal thermally-conductive fins

The beam bending of a MEMS device is minimized by reducing interfacial strength between a sacrificial layer and a MEMS structure.

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Hopewell Junction, NY, United States of America

Hongqing Zhang