Hunan University

Hongjin Wang

Yunze He

Xiaofei Zhang

Ruizhen Yang

Pan Wang

Zihao Sui

Baoyuan Deng

Xiang Li

Provided are a method and apparatus for single-pixel thermal imaging detection of surface and internal defects of a material. The laser module is configured to generate uniform laser light. The spatial light modulation module is configured to spatially encode and modulate received uniform laser light. The projection lens module is configured to project and amplify an encoded light field, and project the encoded light field onto a surface of an object under detection. The optical convergence coupling module is configured to capture and image thermal radiation of the object under detection, and integrate and sum thermal radiation intensities of a projection heating area to obtain a thermal radiation temperature. The thermal infrared single-pixel detector is configured to measure the thermal radiation temperature. The image reconstruction module is configured to sparsely reconstruct data, and finally reconstruct a defect detection result of the projection heating area.

Method and apparatus for single-pixel thermal imaging detection of surface and internal defects of material

A non-destructive testing system for photovoltaic cells includes a non-contact electromagnetic induction device, a short-wave infrared (SWIR) camera or/and a visible-light camera, a thermal imaging device, and an image processing device. The non-contact electromagnetic induction device is configured for generating an external electric field acting on the photovoltaic cell without being in contact with the photovoltaic cell. A direction of the external electric field is parallel to that of an internal electric field of the photovoltaic cell. The SWIR camera or/and the visible-light camera is/are configured for obtaining an optical radiation distribution map within the photovoltaic cell. The thermal imaging device is configured for obtaining a thermal radiation distribution map in the photovoltaic cell. The image processing device is configured for storing and processing the optical and thermal radiation distribution maps. Non-destructive testing equipment including the above system is further provided.

Non-destructive testing system and device for photovoltaic cells

Growing community of inventors

Changsha, China

Hongjin Wang