United Microelectronics Corp.

Hong-Ze Lin

Wei-Shan Liao

Bo-Jui Huang

An-Hung Lin

Ting-Zhou Yan

Kun-Yi Chou

Chun-Wei Chen

Chien-Ming Huang

Chun-Yao Lee

Shin-Kuang Lin

Chin-Lung Chen

Han-Min Huang

Wen-Chun Chang

Wei-Chun Chang

Lung-Chih Wang

Ming-Yong Jian

Shan-Yuan Wang

Shao-Cian Lee

Wen-Ting Hsu

A power MOSFET including a first transistor and a second transistor is provided. The first and the second transistors respectively include following elements. A well region is located in a substrate structure. A trench gate is disposed in the well region. First doped regions are disposed in the well region at two sides of the trench gate. A first metal layer is disposed on a first surface of the substrate structure and electrically connected to the first doped regions. A second doped region is disposed in the substrate structure. A second metal layer is disposed on a second surface of the substrate structure opposite to the first surface and electrically connected to the second doped region. The well regions of the first and the second transistors are separated from each other. The first and the second transistors share the second doped region and the second metal layer.

Power MOSFET

A transistor device including a substrate, a gate structure, a first doped region, a second doped region and a body region is provided. The gate structure is disposed on the substrate. The first doped region and the second doped region are respectively disposed in the substrate at one side and another side of the gate structure. The first doped region and the second doped region have a first conductive type. The body region is disposed in the substrate at one side of the first doped region away from the gate structure. The body region has a second conductive type. The body region and the first doped region are separated by a distance, and no isolation structure exists between the body region and the first doped region.

Transistor device with threshold voltage adjusted by body effect

A method for manufacturing an isolation structure integrated with semiconductor device includes following steps. A substrate is provided. A plurality of trenched gates is formed in the substrate. A first insulating layer and a second insulating layer are sequentially deposited on the substrate. A first etching process is performed to remove portions of the second insulating layer to expose portions of the first insulating layer. A second etching process is then performed to remove the exposed second insulating layer to expose the trenched gates and to define at least an active region.

Isolation structure integrated with semiconductor device and manufacturing method thereof

Method for manufacturing isolation structure integrated with semiconductor device

A lateral-diffused metal oxide semiconductor device (LDMOS) includes a substrate, a first deep well, at least a field oxide layer, a gate, a second deep well, a first dopant region, a drain and a common source. The substrate has the first deep well which is of a first conductive type. The gate is disposed on the substrate and covers a portion of the field oxide layer. The second deep well having a second conductive type is disposed in the substrate and next to the first deep well. The first dopant region having a second conductive type is disposed in the second deep well. The doping concentration of the first dopant region is higher than the doping concentration of the second deep well.

Lateral-diffused metal oxide semiconductor device (LDMOS) and fabrication method thereof

A Schottky diode having a current leakage protection structure includes a Schottky diode unit, a first isolation portion and a second isolation portion. The Schottky diode unit is defined in a substrate and includes a metalized anode, an active region having dopants of first conductive type, a cathode and at least one isolation structure. The first isolation portion having dopants of second conductive type is formed between substrate and active region, and the first isolation portion includes a first well disposed beneath active region, and a first guard ring surrounding active region and connecting to the first well. The second isolation portion having dopants of first conductive type is formed between substrate and the first isolation portion, and the second isolation portion includes a second well disposed beneath the first well, and a second guard ring surrounding the first guard ring and connecting to the second well.

Schottky diode having current leakage protection structure and current leakage protecting method of the same

A lateral diffusion metal-oxide-semiconductor (LDMOS) transistor structure comprises a barrier layer, a semiconductor layer, a source, a first drain and a guard ring. The barrier layer with a first polarity is disposed in a substrate. The semiconductor layer with a second polarity is disposed on the barrier layer. The source has a first polarity region and a second polarity region both formed in the semiconductor layer. The first drain is disposed in the semiconductor layer and has a drift region with the second polarity. The guard ring with the first polarity extends downward from a surface of the semiconductor layer in a manner of getting in touch with the barrier layer and to surround the source and the drain, and is electrically connected to the source.

Lateral diffusion metal oxide semiconductor transistor structure

The present invention provides a lateral diffused metal-oxide-semiconductor device including a first doped region, a second doped region, a third doped region, a gate structure, and a contact metal. The first doped region and the third doped region have a first conductive type, and the second doped region has a second conductive type. The second doped region, which has a racetrack-shaped layout, is disposed in the first doped region, and has a long axis. The third doped region is disposed in the second doped region. The gate structure is disposed on the first doped region and the second doped region at a side of the third doped region. The contact metal is disposed on the first doped region at a side of the second doped region extending out along the long axis, and is in contact with the first doped region.

Lateral diffused metal-oxide-semiconductor device

A high voltage semiconductor device is provided. A first-polarity buried layer is formed in the substrate. A first high voltage second-polarity well region is located over the first-polarity buried layer. A second-polarity base region is disposed within the first high voltage second-polarity well region. A source region is disposed within the second-polarity base region. A high voltage deep first-polarity well region is located over the first-polarity buried layer and closely around the first high voltage second-polarity well region. A first-polarity drift region is disposed within the high voltage deep first-polarity well region. A gate structure is disposed over the substrate. A second high voltage second-polarity well region is located over the first-polarity buried layer and closely around the high voltage deep first-polarity well region. A deep first-polarity well region is located over the first-polarity buried layer and closely around the second high voltage second-polarity well region.

High voltage semiconductor device

A lateral-diffusion metal-oxide-semiconductor device includes a semiconductor substrate having at least a field oxide layer, a gate having a layout pattern of a racetrack shape formed on the substrate, a common source formed in the semiconductor substrate and enclosed by the gate, and a drain surrounding the gate and formed in the semiconductor substrate. The gate covers a portion of the field oxide layer. The common source includes a first doped region having a first conductive type and a plurality of islanding second doped regions having a second conductive type. The drain includes a third doped region having the first conductive type. The third doped region overlaps a portion of the field oxide layer and having an overlapping area between the third doped region and the field oxide layer.

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Hong-Ze Lin