Kingtiger Technology (canada) Inc.

King Tiger Technology, Inc.

Hong Liang Chan

Sunny Lai-Ming Chang

Bosco Chun Sang Lai

Lawrence Wai Cheung Ho

Bosco Lai

Allen Lawrence

Yu Kuen Lam

Sunny Chang

Joseph C Klein

Embodiments described herein relate to systems and methods for testing integrated circuit devices within an environment that is representative of the application environment in which an integrated circuit device will be used. In at least one embodiment, the testing system comprises a second reference integrated circuit device that provides flexibility in testing, allowing only the input to a first reference integrated circuit device of an application system to be tapped and not necessarily both input to and output from the first reference integrated circuit device to be tapped. In some embodiments, the input to the first reference integrated circuit device may be subsequently modified by a controller. The controller is configured to tap first test data transmitted to the first reference integrated circuit device of the application system, and transmit second test data to both the second reference integrated circuit device and at least one integrated circuit device under test, the second test data comprising at least a portion of the first test data. Reference response data received from the second reference integrated circuit device may then be compared with output from the at least one integrated circuit device under test.

Systems and methods for testing integrated circuit devices

Described embodiments relate to a method of testing fully buffered memory modules that involves placing a buffer device, a test vectors generator, and a switch into a memory device tester, coupling the buffer device and the test vectors generator to the switch inside the tester, coupling the switch to an identical buffer device that is located on a memory module with plurality of DRAM devices, and testing the plurality of DRAM devices and the buffer device of the memory module. An apparatus implementing the method comprises a memory device tester, a memory bus, and a plurality of memory modules under test, the tester and the plurality of memory modules connected to the memory bus in a point-to-point manner, the tester comprising a buffer device, a test vectors generator, and a switch, the tester connected to the memory bus through the switch, each memory module under test having a plurality of DRAM devices and an identical buffer device.

Method and apparatus for testing a fully buffered memory module

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Markham, Canada

Hong Liang Chan