Growing community of inventors

Hsinchu, Taiwan

Hong Hocheng

Average Co-Inventor Count = 2.23

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 43

Hong HochengHung-Yin Tsai (2 patents)Hong HochengYu-Ching Lin (2 patents)Hong HochengLi-An Chu (2 patents)Hong HochengChin Chung Nien (2 patents)Hong HochengRong-Shun Chen (2 patents)Hong HochengChien-Hung Lin (1 patent)Hong HochengChung-chen Tsao (1 patent)Hong HochengYu-Cheng Wu (1 patent)Hong HochengYen Chu Chen (1 patent)Hong HochengYun-Liang Huang (1 patent)Hong HochengJhih-Shun Yang (1 patent)Hong HochengHong Hocheng (7 patents)Hung-Yin TsaiHung-Yin Tsai (16 patents)Yu-Ching LinYu-Ching Lin (3 patents)Li-An ChuLi-An Chu (3 patents)Chin Chung NienChin Chung Nien (2 patents)Rong-Shun ChenRong-Shun Chen (2 patents)Chien-Hung LinChien-Hung Lin (76 patents)Chung-chen TsaoChung-chen Tsao (1 patent)Yu-Cheng WuYu-Cheng Wu (1 patent)Yen Chu ChenYen Chu Chen (1 patent)Yun-Liang HuangYun-Liang Huang (1 patent)Jhih-Shun YangJhih-Shun Yang (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Other (4 from 832,680 patents)

2. Tsinghua University (2 from 4,296 patents)

3. National Science Council (1 from 544 patents)


7 patents:

1. 9162294 - Apparatus and method for delamination reduction of composite materials

2. 8985056 - Detecting platform for holding a tiny insect

3. 8755571 - Image method for classifying insects and classifying process for insects

4. 7303703 - Nano-imprint system with mold deformation detector and method of monitoring the same

5. 6909998 - In-situ monitoring method and system for mold deformation in nanoimprint

6. 6872662 - Method for detecting the endpoint of a chemical mechanical polishing (CMP) process

7. 6315885 - Method and apparatus for electropolishing aided by ultrasonic energy means

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12/6/2025
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