Bio-Rad Laboratories, Inc.

Kla Tencor Corporation

Kla Corporation

James Hardie Technology Limited

Other

Kla-Tencor Technologies Corporation

Rensselaer Polytechnic Institute

Hong Chen

Jiali Liao

Xuemei He

Kenong Wu

Christopher Belisle

Yueping Xu

Russell Frost

Caidian Luo

Eugene Shifrin

Jason Z Lin

Lee Olech

Yang Chen

Bjorn Brauer

Weiling Peng

Donald James Merkley

Xiaochun Li

Masatoshi Yamaoka

Chien-Huei (Adam) Chen

Michael John Van Riet

Le Chen

Peter S Gagnon

Chris Maher

Stephanie Chen

Sho Chen

Barry Becker

Chun Leon Chen

Tseu Min Chen

Michael Cook

Russ Frost

Suryanarayana Tummala

Abdurrahman Sezginer

Martin Plihal

Ashok V Kulkarni

Sangbong Park

Subramanian Balakrishnan

Santosh Bhattacharyya

Yong Zhang

James A Smith

Wei Zhao

Steven M Cramer

Chien-Huei Adam Chen

Raghav Babulnath

Ge Cong

Chongjun Jiang

Michal Kowalski

Nurmohammed Patwary

Satya Kurada

Shishir Suman

Ramon Ynzunza

Gangadharan Sivaraman

Shuo Sun

Ravikumar Sanapala

Rahul Lakhawat

Pavan Kumar

Naoshin Haque

Oksen Toros Baris

Qing Luo

Shan Ren

Wei Si

Neil Troy

James Woo

Vidur Pandita

Vivek Bhagat

Rajesh Ramachandran

Jong Min Keum

Daniel Jose Suasnabar

Bryan Louis Walters

Leon Yu

Evgeni Shifrin

Chromatography resins having anionic exchange-hydrophobic mixed mode ligands and methods of using such resins are provided.

Anionic exchange-hydrophobic mixed mode chromatography resins

Chromatography resins having anionic exchange-hydrophobic mixed mode ligands, that are useful for purifying target biomolecules using anionic exchange (i.e., where the ligand is positively charged) and hydrophobic mixed mode chromatography. The chromatography resins allow for efficient purification of target biomolecules (e.g., recombinant proteins, antibodies, antibody-drug conjugates, or antibody derivatives including, but not limited to, antibody fragments and antibody fusions) from a sample, and have been found to be useful in purifying monomeric target biomolecules from aggregate target biomolecules. In an embodiment, the chromatography resins are useful for separating antibodies from one or more components (e.g., contaminants) in the sample.

Anionic exchange-hydrophobic mixed mode chromatography resin

Chromatography resins having mixed mode ligands and methods of using such resins are provided.

Chromatography resin having an anionic exchange-hydrophobic mixed mode ligand

Methods and systems for setting up inspection of a specimen are provided. One system includes one or more computer subsystems configured for acquiring a reference image for a specimen and modifying the reference image to fit the reference image to a design grid thereby generating a golden grid image. The one or more computer subsystems are also configured for storing the golden grid image for use in inspection of the specimen. The inspection includes aligning a test image of the specimen generated from output of an inspection subsystem to the golden grid image.

Setting up inspection of a specimen

A method for manufacturing a mixed-mode chromatography medium is provided. The method can include, for example, oxidizing diol groups on diol-functionalized solid particles having pores of a median diameter of 0.5 micron or greater with substantially no pores of 0.1 micron or less in diameter and having a diol density of from about 200 to about 300 &#x3bc;mol/mL to aldehyde groups, thereby converting said diol-functionalized solid particles to aldehyde-functionalized solid particles; and coupling amine-functionalized ligands to said aldehyde-functionalized solid particles, said amine-functionalized ligands comprising an amine-substituted hydrophobic group joined to an acid moiety selected from the group consisting of a carboxyl group and a sulfo group.

Solid phase for mixed-mode chromatographic purification of proteins

Systems and methods for detecting defects on a reticle are provided. One system includes computer subsystem(s) configured for performing at least one repeater defect detection step in front-end processing during an inspection process performed on a wafer having features printed in a lithography process using a reticle. The at least one repeater defect detection step performed in the front-end processing includes identifying any defects detected at corresponding locations in two or more test images by double detection and any defects detected by stacked defect detection as first repeater defect candidates. One or more additional repeater defect detections may be performed on the first repeater defect candidates to generate final repeater defect candidates and identify defects on the reticle from the final repeater defect candidates.

Print check repeater defect detection

A system includes a controller communicatively coupled to an optical inspection sub-system, the controller configured to: receive training images of a sample; identify alignment targets in the master die; receive a first set of reference images of a first die row of a sample, the first die row including a master die and a first set of reference die; align the first set of reference die to the master die via fine alignment processes to generate a first set of aligned reference images of the first row; receive a second set of reference images of a second die row of the sample; align the second set of reference die to the master die based on the alignment targets and the training images using a course alignment offset value; and align the second set of reference die to the master die via a fine alignment process.

System and method for semiconductor device print check alignment

Dental implant

Dental implant with side-cutting grooves

Methods and systems for transforming positions of defects detected on a wafer are provided. One method includes aligning output of an inspection subsystem for a first frame in a first swath in a first die in a first instance of a multi-die reticle printed on the wafer to the output for corresponding frames, swaths, and dies in other reticle instances printed on the wafer. The method also includes determining different swath coordinate offsets for each of the frames, respectively, in the other reticle instances based on the swath coordinates of the output for the frames and the corresponding frames aligned thereto and applying one of the different swath coordinate offsets to the swath coordinates reported for the defects based on the other reticle instances in which they are detected thereby transforming the swath coordinates for the defects from swath coordinates in the other reticle instances to the first reticle instance.

High accuracy of relative defect locations for repeater analysis

Proteins are purified by a mixed-mode chromatography system formed by attaching a ligand comprising benzamidoacetic acid to a large-pore support matrix, the only linkage between the ligand and the support matrix being a chain having a backbone of no more than three atoms between a phenyl ring and the support matrix.

The present disclosure is directed to mixed mode chromatography media comprising a ligand directly attached to a solid support. In some aspects, the ligand has a chemical formula of The mixed mode chromatography media is useful for binding and purifying proteins from a solution.

Mixed mode ligands

A method may include, but is not limited to, receiving a plurality of reference images of a wafer. The method may include, but is not limited to, receiving the plurality of test images of the wafer. The method may include, but is not limited to, aligning the plurality of reference images and the plurality of test images via a coarse alignment process. The method may include, but is not limited to, aligning the plurality of reference images and the plurality of test images via a fine alignment process after alignment via the coarse alignment process. The fine alignment process may include measuring individual offsets and correcting individual offset data between at least one of the plurality of reference images and the plurality of test images.

System and method for aligning semiconductor device reference images and test images

Growing community of inventors

San Ramon, CA, United States of America

Hong Chen