Von Ardenne Anlagentechnik Gmbh

Holger Proehl

Falk Milde

Jochen Krause

Martin Dimer

Lutz Gottsmann

Tina Schoessler

Thomas Knoth

Christoph Koeckert

Christoph Koekert

An infrared radiation reflecting transparent layer system on a transparent substrate and a method for producing same is provided. The infrared radiation reflecting layer system comprises an infrared radiation reflecting layer sequence which includes a selective function usually consisting of a noble metal, mostly silver, or an alloy thereof and having a good selective reflectivity in the infrared range. The layer sequence is supplemented by at least one transparent dielectric layer of an oxynitride of a metal, a semiconductor or a semiconductor alloy having a low to moderate refractive index arranged directly on the substrate or above the infrared radiation reflecting layer sequence.

Infrared reflecting layer system for transparent substrate

A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction.

Method and device for measuring optical characteristic variables of transparent, scattering measurement objects

A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor.

Measuring device for measuring optical properties of transparent substrates

A measuring instrument, in particular for transmission measurement with transparent substrates, comprises a measuring head with a light emitting element for emitting a light beam and a light receiver element for recording an incident light beam, and a retro-reflector for reflection of the emitted light beam. The measuring instrument allows transmission measurements to be carried out on transparent substrates with only one reflection measuring head. The measuring instrument also allows reflection measurements to be carried out, for example on non-transparent substrates or by tilting the measuring head and covering the retro-reflector. The measuring instrument only requires one measuring head and can therefore be produced more cost-effectively. It does not require calibration, as the retro-reflector also reflects the light in the original direction in the case of oblique incidence and in the event of positional changes caused by process or operational factors (vibrations etc.).

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Dresden, Germany

Holger Proehl