Infineon Technologies Ag

Suss Microtec Test System Gmbh

Holger Heuermann

Carsten Ahrens

Reinhard Losehand

Josef-Paul Schaffer

Wolfgang Hartung

Arash Sadeghfam

Jens Ruediger

A matching network for matching an antenna to a transmitter or receiver comprises an input port for receiving high-frequency power, an output port and a switchable impedance transformation circuit, which is connected between the input port and the output port. The impedance transformation circuit comprises a CMOS switch in a high-frequency path, which has a first switching state and a second switching state. The impedance transformation circuit is implemented to match a first impedance applied to the output port to a first predetermined impedance in the first switching state, and to match a second impedance applied to the output port to a second predetermined impedance in the second switching state. The inventive matching network allows a particularly good utilization of power provided by a transmitting amplifier or an antenna.

Matching network

A diode circuit includes a pin diode structure, wherein the n-semiconductor layer is a buried layer, on which the i-area is deposited by an epitaxy method, and wherein a p-semiconductor layer is introduced into the epitaxy layer. A contacting of the p-semiconductor layer and a contacting of the n-semiconductor layer are arranged on the same main surface of the semiconductor substrate so that an integration with an integrated capacitor, an integrated resistor and/or an integrated inductor is possible.

Diode circuit and method of producing a diode circuit

The invention relates to a method for calibrating a vectorial network analyzer having n measurement ports and at least 2n measurement locations (n&#x3e;1) by successive measurement of the reflection and transmission parameters at different two-port calibration standards, which are connected between the measurement ports in any desired order and must all have a transmission path, and three different n-port calibration standards, which are connected between the measurement ports in any desired order and which are not permitted to show transmission and by calculation of error coefficient and scattering matrix [Sx] with the 10-term or 7-term multiport method. An object of the invention is to propagate a method for calibrating these vectorial network analyzer used for multiport measurement which permits a calibration with increased precision and considerable reproducibility of measurement.

Calibration method for carrying out multiport measurements on semiconductor wafers

A filter arrangement includes one first resonator circuit connected between a first node and a second node. A second resonator circuit is connected between a third node and a fourth node. The first resonator circuit and the second resonator circuit are intercoupled. Further, an inductive device is provided, connected between the first node and the third node.

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Weyarn, Germany

Holger Heuermann