Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

Holger Birk

Rafael Storz

Johann Engelhardt

Volker Seyfried

Bernd Widzgowski

Kyra Moellmann

Heinrich Ulrich

Frank Schreiber

Dirk-Oliver Fehrer

Holger Nissle

Johan Engelhardt

Werner Knebel

Hilmar Gugel

Juergen Hoffmann

Marcus Dyba

William C Hay

Joachim Bradl

Ingo Boehm

Lars Friedrich

Joerg Bewersdorf

Juergen Riedmann

Volker Leimbach

Mario Belzer

Vishnu Vardan Krishnamachari

Roland Moschel

Vishnu Varden Krishnamachari

Derek Webster

Harald Brueggemann

Kyra Möllmann

Florian Warken

A method for actuating an acoustooptical element includes generating an actuation signal by a direct digital synthesis (DDS) method using a signal value sequence made up of at least two frequency components. A signal generator for actuating an acoustooptical element is configured to perform the method. An arrangement includes the signal generator and the acoustooptical element. A microscope includes the arrangement.

Method and signal generator for controlling an acousto-optic element

A method for scanning a sample includes generating at least two illumination points in order to form a point pattern, wherein the point pattern has a settable number of illumination points. At least one freely selectable parameter for defining the point pattern is preset or is set. At least one predefined region of the sample is scanned by moving the point pattern defined by the freely selectable parameter along a first direction such that scan lines assigned to the illumination points of the point pattern are generated, and along a second direction such that further scan lines are generated in each case following the scan lines. The movement of the point pattern in the second direction is carried out in scan steps of identical size or at a constant speed. The illumination points of the point pattern are arranged on a line along the second direction.

Method and device for scanning a sample

A method for evaluating a single-photon detector signal includes duplicating the single-photon detector signal into a first and a second signal. The first signal is processed and the second signal is either not processed or is processed in a manner different from the first signal. A differential signal is formed between the unprocessed or differently processed second signal and the processed first signal. The differential signal is evaluated to determine pulse events.

Method for evaluating a single-photon detector signal

A method for counting photons using a photomultiplier includes obtaining a measurement signal from a raw signal produced by the photomultiplier by correcting the raw signal for a noise signal and/or an offset, wherein an incident photon produces a pulse in the raw signal. The measurement signal is integrated over time to form an analog integrated measurement signal. A number of photons that are incident in the photomultiplier is ascertained by comparing a value of the analog integrated measurement signal to an integral proportionality value which corresponds to a specific number of photons incident in the photomultiplier.

Method for counting photons by means of a photomultiplier

A device for detecting light includes at least one silicon photomultiplier (SiPM) having an array of a plurality of single-photon avalanche diodes (SPADs), the array being larger in area than an incident light. The device is configured so as to at least one of activate and analyze only the SPADs upon which a specific minimum intensity of light impinges.

Device and method for detecting light

The invention relates to a method and a system for central computer controlled execution of at least one test run in a scanning microscope, particularly a confocal microscope, wherein at least one first software module of an application software is tested. The invention achieves the aim by a network made of individual scanning microscope clients and a central server. The clients can be contacted via a network interface and are administered in a central directory in the server. The application software for the individual components of a scanning microscope is made of individual software modules, each associated with a potential test. In order to be able to perform the various tests, the scanning microscope clients have been equipped on the hardware side with additional sensors and components that allow various operating parameters to be determined.

System and method for computer-controlled execution of at least one test in a scanning microscope

A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected.

Detector apparatus

In order to identify scan coordinate values (&#x3c6;, &#x3b8;) for operating a scanning unit () of a confocal scanning microscope (), spherical scan coordinate values (&#x3c6;, &#x3b8;) are identified, as a function of Cartesian image coordinates (X, Y) of image points of an image () to be created of a sample (), with the aid of a coordinate transformation of the Cartesian image coordinate values (X, Y) into a spherical coordinate system. The scanning unit () is operated as a function of the spherical scan coordinate values (&#x3c6;, &#x3b8;).

Method for correcting image distortions in a confocal scanning microscope

A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor.

Detector apparatus having a cooling component

A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing.

A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source (), which emits an illuminating light beam (). A focusing lens system () focuses the illuminating light beam () on a region to be examined of a sample (). An actuator arrangement moves the focusing lens system () according to a prescribed scanning pattern transversely in relation to a center axis of the illuminating light beam () and/or in relation to a housing of a structural unit () that encloses the focusing lens system ().

Scanning microscope and method for optically scanning one or more samples

The invention relates to a device for scanning an object comprising a carrier body () and a first electromagnetic drive (). The carrier body () is movably mounted in a plane and holds an optical element () that focuses an illuminating light beam () on a first object plane of the object that is parallel to the plane. The first electromagnetic drive () moves the carrier body () with the optical element () and a focus region () of the illuminating light beam () within the first object plane.

Device for scanning an object, method for operating the device and scanning microscope

An apparatus for damping sound in the optical beam path of a microscope, having an acoustic insulation housing for encapsulating a sound-emitting component, preferably a rapidly moving or oscillating beam deflection means, in particular a resonantly oscillating mirror, the housing comprising at least one optical entrance/exit opening, is characterized in that the housing, preferably the opening of the housing, is embodied and/or configured in such a way that the sound otherwise emerging from the housing is largely extinguished by destructive interference without thereby influencing the optical beam. A microscope having a corresponding apparatus is furthermore claimed.

Apparatus for damping sound in the optical beam path of a microscope, and microscope having a corresponding apparatus

An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components.

Acousto-optical system, microscope and method of use of the acousto-optical system

A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

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Meckesheim, Germany

Holger Birk