Samsung Electronics Co., Ltd.

Boston University

Hojun Lee

Sangwan Nam

Junyoung Ko

Chaehoon Kim

Minjae Seo

Jiwon Seo

Wookrae Kim

Myungjun Lee

Junho Shin

Seungbeom Park

Hao Wang

Lei Tian

Jangwoon Sung

Jiabei Zhu

A substrate inspection apparatus includes a light irradiator including an objective lens and a plurality of optical fibers. The objective lens is configured to irradiate light to an illumination area on a semiconductor substrate having a plurality of circuit pattern layers, the plurality of optical fibers are adjacent a periphery of the objective lens and are configured to irradiate the light to a peripheral area adjacent the illumination area. A light generator is configured to generate the light. The light generator is configured to change an irradiation angle of the light to selectively irradiate the light to one or more of the objective lens and the plurality of optical fibers. A light analyzer is configured to obtain images of the circuit pattern layers from the light reflected from the illumination area and the peripheral area. The light analyzer is configured to model each of the circuit pattern layers of the semiconductor substrate to obtain image models and to measure an overlay between the circuit pattern layers through the images and the image models.

Substrate inspection apparatus and substrate inspection method

A method of operating a nonvolatile memory device which includes at least one memory block is provided. The method includes providing a plurality of word-lines with a voltage during a word-line set-up period, precharging a plurality of driving lines with a voltage during a word-line development period, detecting a voltage drop of a sensing node during a sensing period, and detecting leakage based on the voltage drop.

Nonvolatile memory device and method of operating a nonvolatile memory

Growing community of inventors

Uiwang-si, South Korea

Hojun Lee