Samsung Electronics Co., Ltd.

Ho Young Shin

Hyun-Jin Shin

Ji-Sung Kim

Myeong Hee Oh

A nonvolatile memory device includes a memory cell array including a plurality of memory cells that are programmed based on a high voltage, a high voltage generator to generate the high voltage by boosting an input voltage based on a pumping clock, a pumping clock generator to generate the pumping clock, a high voltage detector to generate a detection signal by comparing an adjustment voltage with a reference voltage, a programming current controller to adjust a programming current flowing through each of selected memory cells of the plurality of memory cells; and a control logic to adjust a frequency of the pumping clock and a current driving capability of the programming current based on the detection signal during a programming period with respect to the selected memory cells. The detection signal includes information indicating whether the high voltage reaches to a target voltage.

Nonvolatile memory device and memory system including thereof

A latch circuit including: a first inverter having a first pull-up transistor connected between a first power supply node and a first output node, and a first pull-down transistor connected between a second power supply node and the first output node; a second inverter having a second pull-up transistor connected between the first power supply node and a second output node, and a second pull-down transistor connected between the second power supply node and the second output node; a first current control transistor connected between the first pull-up transistor and the first output node; a second current control transistor connected between the second pull-up transistor and the second output node; a third current control transistor connected between the first pull-down transistor and the first output node; and a fourth current control transistor connected between the second pull-down transistor and the second output node.

Latch circuit

A charge pump includes a first pumping capacitor configured to pump a first voltage of a first node, in response to a first clock signal, a gate pumping capacitor configured to pump a second voltage of a second node, in response to a second clock signal, a charge transfer transistor including a first source connected to a first one of a third node and the first node, a first gate connected to the second node, and a first drain connected to a remaining one of the first node and the third node, a gate control transistor including a second source connected to the first one of the third node and the first node, a second gate connected to the remaining one of the first node and the third node, and a second drain connected to the second node, and a gate discharge or charge unit.

Charge pump, and high voltage generator and flash memory device having the same

A memory device includes a memory cell, a bit line connected to the memory cell, a control voltage generator configured to generate a proportional to absolute temperature (PTAT) current and generate an analog control voltage inversely proportional to the PTAT current, and a load current control circuit configured to control a first load current supplied to the bit line based on the analog control voltage.

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Gunpo-si, South Korea

Ho Young Shin