Samsung Electronics Co., Ltd.

Georgia Tech Research Corporation

Ho Sun Yoo

Sung Yeol Kim

Min Sung Kim

Oh H Kwon

Abhijit Chatterjee

Jung Ik Ha

Jin-Kyu Choi

In-su Yang

Young Doo Yoon

Jang Hwan Kim

Jae Hyun Baek

Hyun Woo Choi

Hyung Sun You

Xian Wang

Thomas Moon

Nicholas Tzou

Jong Ho Kim

So Hee Han

A semiconductor test system includes a user device configured to operate a reference device in accordance with an interface signal based on a timing signal having a variable operating frequency, a pattern synthesis apparatus configured to measure an interval between adjacent edges of the timing signal transmitted from the user device, and extract a logic value of the interface signal in accordance with the timing signal so as to generate test pattern data, and a test device configured to receive the test pattern data, reconstruct the timing signal based on the measured interval, generate a test driving signal such that the logic value is extracted from a device under test (DUT) based on the reconstructed timing signal, and apply the test driving signal to the DUT so as to determine an operating state of the DUT.

Pattern synthesis apparatus and semiconductor test system having the same

A sensorless control apparatus may include: a speed command unit configured to output a speed command to an electric motor; a current detector unit configured to detect electric current flowing through the electric motor if a voltage being output according to the speed command is supplied to the electric motor; a rotor angle calculation unit configured to calculate a magnetic flux of a rotor of the electric motor based on the detected electric current and the voltage being output according to the speed command, and to calculate an angle of the rotor from the calculated magnetic flux; and/or an out-of-step sensing unit configured to sense an out-of-step of the rotor according to a comparison of the calculated angle of the rotor with an angle of the rotor estimated based on a sensorless control algorithm.

Sensorless control apparatuses and control methods thereof

An apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters (AD converter) that are arranged in parallel to each other to sample an input signal at different frequencies; a plurality of frequency synthesizers configured to provide each AD converter with a different sampling frequency; a signal processor configured to receive an output of the plurality of AD converters to reconstruct the input signal; and/or a controller configured to receive and process a trigger signal.

Apparatuses for measuring high speed signals and methods thereof

A phase current prediction method is disclosed. The phase current prediction method predicts current representative of a PWM period using a motor model which receives current measured through a single current sensor as an input, instead of the measured current, and determines the predicted current to be phase current.

Method to predict phase current

Growing community of inventors

Seongnam-si, South Korea

Ho Sun Yoo