Samsung Electronics Co., Ltd.

Ho-Suk Lee

You-Keun Han

Jae-Goo Lee

Young-Man Ahn

Byung-Se So

Yang-Ki Kim

Seung-Jin Seo

Seung-Man Shin

Seok-Il Kim

Jung-Kuk Lee

Hui-chong Shin

Young-hyun Jun

A semiconductor device includes a resistor terminal, a reference voltage generator and a detector. The resistor terminal is connected to an external resistor. The reference voltage generator generates at least one reference voltage. The detector generates a detection signal based at least in part on a resistor terminal voltage and the at least one reference voltage. The detection signal indicates a state of an electrical connection to the resistor terminal. The resistor terminal voltage is a voltage at the resistor terminal.

Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices

A memory module, a memory unit, and a hub with a non-periodic clock and methods for using the same. An example memory module may include a phased locked loop, receiving an external, periodic clock and generating one or more internal periodic clocks and a plurality of memory units, receiving one of the internal periodic clocks or a non-periodic clock from an external source.

Memory module, memory unit, and hub with non-periodic clock and methods of using the same

Provided are a reference current generating method and a current reference circuit. The reference current generating method includes generating a first current using a NMOS transistor and a second current using a PMOS transistor, calculating a current difference between the first and second currents, generating a third current which has a similar current/temperature slope as the second current by multiplying the current difference by a proportional constant, and generating a reference current by subtracting the third current from the second current.

Reference current generating method and current reference circuit

Growing community of inventors

Hwaseong-si, South Korea

Ho-Suk Lee