Taiwan Semiconductor Manufacturing Comp. Ltd.

Mediatek Corporation

Ho-Chieh Hsieh

Sang Hoo Dhong

Cheng-Chung Lin

Ming-Zhang Kuo

Kuo Feng Tseng

Hui-Zhong Zhuang

Lee-Chung Lu

Kin-Hooi Dia

Kuo-Feng Tseng

A semiconductor structure is provided. A logic cell with a logic function includes a plurality of first transistors in an active region over a semiconductor substrate, a second transistor in the active region, a third transistor in the active region, and first and second isolation structures on opposite edges of the active region and extending along the first direction. Each first transistor includes a first gate electrode extending along the first direction. The second transistor includes a second gate electrode extending along the first direction. The third transistor includes a third gate electrode extending along the first direction. The first gate electrodes are disposed between the first and second isolation structures. The second gate electrode is disposed between the first gate electrodes and the first isolation structure. The third gate electrode is disposed between the first gate electrodes and the second isolation structure.

Logic cell with small cell delay

An integrated circuit comprises standard cells arranged in rows and columns. The integrated circuit also comprises tap cells arranged in rows and columns. The tap cells each comprise a substrate having a first dopant type and a thickness from a first surface of the substrate to a second surface of the substrate. The integrated circuit further comprises a well region in the substrate having a second dopant type different from the first dopant type and a depth from the first surface of the substrate less than the thickness of the substrate. The integrated circuit additionally comprises a first quantity of rows of tap cells and a second quantity of rows of tap cells less than the first quantity. Each row of the first quantity of rows of tap cells comprises at least one well contact, and each row of tap cells of the second quantity of tap cells comprises at least one substrate contact.

Integrated circuit with well and substrate contacts

One or more systems and methods for scan cell assignment for a design layout of a semiconductor arrangement are provided. The design layout is evaluated to identify a set of sequential cells, such as flip flops connected to circuitry by data paths. Sequential cells within the set of sequential cells are assigned to either a scan cell assignment or a non-scan cell assignment based upon a control path criterion, a register bank criterion, a pipeline depth criterion, a sequential loop criterion, or other criteria to create a cell assignment list. Scan paths are connected to sequential cells assigned to the scan cell assignment so that test patterns can be sent to and received from such sequential cells during testing of the semiconductor arrangement for defects. Power, performance, and area utilization are improved because at least some sequential cells are assigned to the non-scan cell assignment.

Scan cell assignment

A memory includes a word line, a bit line and a complementary bit line. A memory cell has a data node coupled to the bit line and a complementary data node coupled to the complementary bit line. The word line controls access to the memory cell. A circuit is coupled to the bit line and the complementary bit line. The circuit is configured to pull up to a high voltage, pull down to a low voltage, or float the bit line and the complementary bit line based on a first timing of pre-charging and a second timing of write driving. The first timing and the second timing are synchronized.

Growing community of inventors

Hsinchu, Taiwan

Ho-Chieh Hsieh