Kabushiki Kaisha Kobe Seiko Sho

Shinkokensa Service Kabushiki Kaisha

Hitoshi Utsumi

Norio Suzuki

Masayoshi Iwasaki

Kenji Aburatani

Takehiko Ooshiro

Kousuke Sahara

Kohichi Ishikawa

Kazuo Miyake

An apparatus which measures a thickness of a layer using transverse waves of ultrasonic waves, and includes: a sensor unit having a probe for obliquely transmitting and receiving to and from the surface of a material to be measured having first and second layers with different acoustic impedances in a depth direction: an extractor for extracting, from a wave reception signal representing waves received by the probe, reflected waves from a boundary between the first and the second layers of the material; and a calculator for calculating a distance between the surface of the material and the boundary.

Apparatus for measuring a layer thickness using transverse waves of

For the inspection of a square billet, an ultrasonic testing technique using an angle beam is performed using a phased array system. The phased array probe is disposed in a plane perpendicular to the axial direction of a square billet, at a prescribed distance from the surface of the billet and set at a prescribed angle with respect to the billet surface. The billet is inspected both inside and at the surface layer when the ultrasonic beam is electronically scanned. Inspection of the surface layer only is also performed using a surface defect inspection apparatus. Determination of internal defects (including subsurface defects) is performed based on the subtraction of information from the surface defect inspection from the information from the ultrasonic inspection.

Inspection method of square billet using electronic scanning

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Kobe, Japan

Hitoshi Utsumi