Omron Corporation

Hitoshi Nakatsuka

Motoharu Okuno

Tomonori Ariyoshi

Takeshi Inoda

Toyoo Iida

Yutaka Kato

Shinya Matsumoto

Jun Ota

Tetsuya Kiguchi

An optical assembly () for a three-dimensional measurement device is equipped with: an optical lens () that forms a pair of conjugate planes having an optically conjugate relationship; an optical device () that is disposed on one of the pair of conjugate planes; a temperature sensor () for detecting the temperature of the optical lens (); a heater () for heating the optical lens (); and a control part that controls the operation of the heater () on the basis of the result of the detection made by the temperature sensor () such that the optical lens () reaches a constant temperature.

Optical assembly for three-dimensional measurement device and three-dimensional measurement device equipped with same

Sensor for industrial robot

This three-dimensional measurement device includes: a light source, a lens guiding light from the light source to a subject, a photomask disposed on the optical axis between the light source and lens and having a predetermined pattern, a driving device changing the position of one member from the lens and photomask or changing an optical characteristic of the lens, and a control unit controlling the driving device. The control unit fixes an image formation position for light/dark pattern light formed by the photomask at the position of the subject by fixing the position of said member or the optical characteristic of the lens when specifying a first mode, and varies the position of the member or the optical characteristic of the lens to vary the image formation position for the light/dark pattern light such that the light/dark difference caused by the light/dark pattern light is smaller than in the first mode when specifying a second mode.

Three-dimensional measurement device, sensor device for three-dimensional measurement, and method for performing control in three-dimensional measurement device

A measurement system includes a first distance calculation unit that searches for a corresponding region, indicating a same array as an array of codes indicated by a predetermined number of reference patterns included in a unit region set in the projection pattern, from a set of the codes, and calculates a distance from an irradiation reference surface of the projection pattern to each portion of the object on the basis of a search result of the corresponding region, and a second distance calculation unit that attempts to estimate a distance for the defective portion for which the first distance calculation unit is not able to calculate the distance by reconstructing an incomplete code corresponding to the defective portion using peripheral information in the input image.

Measurement system and measurement method

A measurement system includes a first search part and a second search part. The first search part searches a set of codes for a corresponding region that indicates the same sequence as a model code string composed of a predetermined number of codes included in a unit region set in a projection pattern. The second search part searches the set of codes for a code that matches each code included in a model code string that fails in the search for the corresponding region among the model code strings included in the projection pattern, and then determines recognition of the model code string when the number of the codes that fail to be searched in this search is equal to or smaller than a predetermined number.

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Kawanishi, Japan

Hitoshi Nakatsuka