Olympus Corporation

Hitoshi Hatano

Katashi Ishihara

An improved laser scanning microscope and method of use are disclosed that enable polarization anisotropy measurements to be made with greater sensitivity and accuracy. A controllable optical element is provided in a light path between a laser source and a sample, and is controlled so that the sample is alternately irradiated with light beams that are orthogonally polarized. This enables the signal strength to be higher than with previous laser scanning microscopes. Moreover, because the orthogonally polarized light beams that are alternately incident onto a sample may be switched at a high rate, a reduction may be achieved in the influence of molecular motion within a sample in which high speed biological reactions are observed.

Laser scanning microscope that includes a scanning device and at least one controllable optical element that controls the polarization plane of light incident onto a sample, and method of use

Growing community of inventors

Hino, Japan

Hitoshi Hatano