Fujitsu Corporation

Hisaya Urabe

Naoyuki Takeshita

Katsuhiko Hirashima

Hiroaki Shiraishi

Tateo Shimaru

Masaru Nishida

Kunihiko Matsumoto

Masahiro Dohi

Tsuneharu Suzuki

A failure prediction apparatus includes a memory and a processor coupled to the memory. The processor acquires a score based on an output of each of a plurality of sensors associated with each of a plurality of circuit arrangement regions, in each of the plurality of circuit arrangement regions a logic circuit constructed by programming is arrangeable, and performs a process of making a determination on a possibility of an occurrence of a failure with respect to each of the plurality of circuit arrangement regions based on the score for each of the circuit arrangement regions.

Circuit arrangement region failure prediction apparatus and method based on sensor output score

A transmission apparatus includes a first storage configured to store data received from external into a write enable area, a second storage configured to store the data in accordance with a write request and output a retry request in response to occurring an error of writing a first data included in the data, and a controller configured to read the data from the first storage and send the write request to the second storage, set an area of the first storage storing the first data to a write disable area in combination with stop sending the retry request to external when receiving the retry request from the second storage, and send the first data reading from the write disable area of the first storage to external in response to a read request from external.

Transmission apparatus and retry method

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Fukuoka, Japan

Hisaya Urabe