Shimadzu Corporation

Hisato Fukuda

Tomoki Sasayama

Ryuta Shibutani

Tomoyo Tao

Atsuhiko Otaguro

Fumiya Katsutani

A Raman infrared compound microscope device includes: a first light source that generates laser light; a second light source that generates infrared light; a third light source that generates visible light; and a first optical system. The first optical system orients the visible light having reached the first optical system in different directions between when performing a Raman analysis using Raman light generated from a sample by irradiation of the laser light and when performing a first infrared analysis using the infrared light having passed through the sample.

Raman infrared compound microscope device

A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamberand an interference optical system are mounted, where an accessorycan be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading meansfor reading accessory information provided to the accessorywhen the accessoryis mounted in the sample chamber; and setting condition changing means (controller) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means, the setting condition varying depending on, e.g., a difference in weight between respective accessories

Fourier transform infrared spectrophotometer

An interference spectrophotometer including a movable mirror unit having a movable mirror capable of reciprocating movement; a stationary mirror; an infrared light source unit which emits an infrared light; a beam splitter; an interference light detection unit which detects light intensity information of light transmitted or reflected by a sample; a movable mirror velocity information detection unit which detects movable mirror velocity information for movable mirror; and a control unit which acquires the light intensity information and movable mirror velocity information and computes the absorption or transmission spectrum of the sample; wherein the interference spectrophotometer further comprises a storage unit which stores a target movable mirror velocity range, and control unit does not employ light intensity information obtained when the movable mirror velocity of movable mirror was outside the target movable mirror velocity range for computing the absorption or transmission spectrum of the sample.

Interference spectrophotometer that corrects light intensity information using mirror velocity information

When a system is powered on and becomes ready for a measurement, it automatically begins to acquire an interferogram (IFG). When a new IFG is acquired, if a background (BKG) IFG is present in a memory but there is no sample IFG (Sand S), the new IFG is compared with the BKG-IFG and, if the two IFGs are identical, the new IFG is added to the BKG-IFG (S, Sand S). When an operator sets a sample in a sample chamber and the new IFG shows a change, the IFG is stored as a sample IFG (S). Then, a sample measurement is initiated. After that, when a new IFG is found to be identical to the sample IFG stored in the memory (Sand S), the new IFG is added to the sample IFG (S). The sample measurement is completed when the number of sample IFGs stored in the memory has reached a predetermined accumulation number. Thus, the sample measurement is automatically performed, for which the operator only needs to set a sample. The workload on the operator is reduced and the measurement task can be efficiently performed.

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Kyoto, Japan

Hisato Fukuda