Rigaku Corporation

Hisashi Konaka

Shintaro Kobayashi

Katsuhiko Inaba

Hideo Toraya

Akihiro Himeda

Toru Mitsunaga

Keigo Nagao

According to an aspect of the present invention, an X-ray diffraction apparatus is provided. The X-ray diffraction apparatus comprises: an X-ray source configured to irradiate a sample with an X-ray; a sample stage configured to allow the sample to be disposed in such a manner that the X-ray is diffracted; a detector configured to detect a diffracted X-ray, which is the X-ray that has been diffracted, in one dimension at a detection strip; a slit member provided between the sample stage and the detector, comprising a slit through which the diffracted X-ray can pass; wherein an axis in a longitudinal direction of the slit is parallel to an axis in a longitudinal direction of the detection strip.

X-ray diffraction apparatus and measurement method

There is provided a control apparatusthat controls a tilt of a sample, the control apparatus comprising an input sectionthat receives an input of inclination information representing inclination of the sample with respect to a &#x3d5; axis; an adjustment amount determination sectionthat determines adjustment amounts of a &#x3c9; value and a &#x3c7; value for correcting a deviation amount between a scattering vector and a normal line to a sample surface or a lattice plane with respect to a &#x3d5; value that varies, using the inclination information; and a drive instruction sectionthat drives a goniometer according to &#x3d5; axis rotation of the sample, based on the determined adjustment amounts of the &#x3c9; value and the &#x3c7; value, during an X-ray diffraction measurement.

Control apparatus, system, method, and program

Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle a in a pole figure with the small number of times of &#x3d5; scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of. receiving input of a diffraction angle 2&#x3b8;; and determining an angle &#x3c9; formed by an incident X-ray and an x-axis, and a tilt angle &#x3c7; of a sample in each &#x3d5; scan for a rotation angle &#x3d5; within a sample plane so as to make a range of an angle a continuous from &#x3b1;=90&#xb0; to &#x3b1;=0&#xb0; without overlapping, the angle &#x3b1; being formed by the sample plane and a scattering vector, the range of the angle &#x3b1; are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the diffraction angle 2&#x3b8;, in which determining the angle &#x3c9; and the tilt angle &#x3c7; is repeated.

Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction

To provide a structure refining apparatus, a method and a program capable of univocally and appropriately setting a restraint with a statistically feasible intensity and specifying a crystal structure model making use of a measurement result under a constraint condition to reasonable known data. A structure refining apparatusadjusting the crystal structure model on the basis of the measurement result and the known data includes a restraint applying unitconfigured to apply the restraint such that a divergence between a parameter specifying a crystal structure and a known representative value becomes equivalent to a standard uncertainty of the known representative value and a structure specifying unitconfigured to specify the crystal structure model on the basis of the measurement result under the applied restraint.

Structure refining apparatus, method and program

In an X-ray diffraction method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror is a combination of plural flat reflective surfaces, the respective centers of which are located on an equiangular spiral having a center that is located on a surface of the sample. The X-ray detector is one-dimensional position-sensitive in a plane parallel to the diffraction plane. X-rays that have been reflected at different flat reflective surfaces reach different points on the X-ray detector respectively. A correction is performed for separately recognizing different reflected X-rays that may have been reflected at the different flat reflective surfaces, and might be mixed with each other on the same detecting region of the X-ray detector.

Growing community of inventors

Hamura, Japan

Hisashi Konaka